T. Shimono

	1986
2		Masato Kawai, T. Shimono, S. Funatsu: Test Data Quality Assurance. ITC 1986: 848-852
	1985
1		T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, S. Funatsu: An AC/DC Test Generation System for Gate Array LSIs. ITC 1985: 329-333

Coauthor Index

1	S. Funatsu	[1] [2]
2	Masato Kawai	[1] [2]
3	K. Oozeki	[1]
4	M. Takahashi	[1]