Glenn Shirley

	2009
2		W. Robert Daasch, Glenn Shirley, Amit Nahar: Statistics in Semiconductor Test: Going beyond Yield. IEEE Design & Test of Computers 26(5): 64-73 (2009)
	2001
1		Bill Bottoms, Jim Chung, Bernd Koenemann, Glenn Shirley, Lisa Spainhower: Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue. VTS 2001: 153-154

Coauthor Index

1	Bill Bottoms	[1]
2	Jim Chung	[1]
3	W. Robert Daasch	[2]
4	Bernd Koenemann	[1]
5	Amit Nahar	[2]
6	Lisa Spainhower	[1]

Colors in the list of coauthors