| 2007 | ||
|---|---|---|
| 1 | EE | Tomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara: TAM Design and Optimization for Transparency-Based SoC Test. VTS 2007: 381-388 |
| 1 | Hideo Fujiwara | [1] |
| 2 | Hideyuki Ichihara | [1] |
| 3 | Tomoo Inoue | [1] |
| 4 | Tomokazu Yoneda | [1] |