John Van Slyke

	2004
1		Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski: Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294

Coauthor Index

1	Brady Benware	[1]
2	Mark Kassab	[1]
3	Martin Keim	[1]
4	Prabhu Krishnamurthy	[1]
5	Cam Lu	[1]
6	Robert Madge	[1]
7	Janusz Rajski	[1]