Uwe Sparmann

	1999
15		Uwe Sparmann, H. Mueller, Sudhakar M. Reddy: Universal delay test sets for logic networks. IEEE Trans. VLSI Syst. 7(2): 156-166 (1999)
	1998
14		Uwe Sparmann, Lars Köller: Improving Path Delay Fault Testability by Path Removal. VTS 1998: 200-209
	1996
13		Uwe Sparmann, H. Mueller, Sudhakar M. Reddy: Minimal Delay Test Sets for Unate Gate Networks. Asian Test Symposium 1996: 155-
12		Harry Hengster, Uwe Sparmann, Bernd Becker, Sudhakar M. Reddy: Local Transformations and Robust Dependent Path Delay. ITC 1996: 347-356
11		Prasanti Uppaluri, Uwe Sparmann, Irith Pomeranz: On minimizing the number of test points needed to achieve complete robust path delay fault testability. VTS 1996: 288-295
10		Uwe Sparmann, Sudhakar M. Reddy: On the effectiveness of residue code checking for parallel two's complement multipliers. IEEE Trans. VLSI Syst. 4(2): 227-239 (1996)
	1995
9		Uwe Sparmann, D. Luxenburger, Kwang-Ting Cheng, Sudhakar M. Reddy: Fast Identification of Robust Dependent Path Delay Faults. DAC 1995: 119-125
	1994
8		Uwe Sparmann, Sudhakar M. Reddy: On the Effectiveness of Residue Code Checking for Parallel Two's Complement Multipliers. FTCS 1994: 219-228
7		Thomas Burch, J. Hartmann, Günter Hotz, M. Krallmann, U. Nikolaus, Sudhakar M. Reddy, Uwe Sparmann: A Hierarchical Environment for Interactive Test Engineering. ITC 1994: 461-470
6		Paul Molitor, Uwe Sparmann, Dorothea Wagner: Two-Layer Wiring with Pin Preassignments is Easier if the Power Supply Nets are Already Generated. VLSI Design 1994: 149-154
	1991
5		Bernd Becker, Uwe Sparmann: A uniform test approach for RCC-adders. Fundam. Inform. 14(2): 185-219 (1991)
4		Bernd Becker, Uwe Sparmann: Computations over Finite Monoids and their Test Complexity. Theor. Comput. Sci. 84(2): 225-250 (1991)
	1990
3		Bernd Becker, Thomas Burch, Günter Hotz, D. Kiel, Reiner Kolla, Paul Molitor, Hans-Georg Osthof, Gisela Pitsch, Uwe Sparmann: A graphical system for hierarchical specifications and checkups of VLSI circuits. EURO-DAC 1990: 174-179
	1988
2		Bernd Becker, Uwe Sparmann: Regular Structures and Testing: RCC-Adders. AWOC 1988: 288-300
1		Uwe Sparmann: Design and Test of a Pattern Matching Circuit. Elektronische Informationsverarbeitung und Kybernetik 24(7/8): 329-338 (1988)

Coauthor Index

1	Bernd Becker	[2] [3] [4] [5] [12]
2	Thomas Burch	[3] [7]
3	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[9]
4	J. Hartmann	[7]
5	Harry Hengster	[12]
6	Günter Hotz	[3] [7]
7	D. Kiel	[3]
8	Reiner Kolla	[3]
9	Lars Köller	[14]
10	M. Krallmann	[7]
11	D. Luxenburger	[9]
12	Paul Molitor	[3] [6]
13	H. Mueller	[13] [15]
14	U. Nikolaus	[7]
15	Hans-Georg Osthof	[3]
16	Gisela Pitsch	[3]
17	Irith Pomeranz	[11]
18	Sudhakar M. Reddy	[7] [8] [9] [10] [12] [13] [15]
19	Prasanti Uppaluri	[11]
20	Dorothea Wagner	[6]

Colors in the list of coauthors