 | 2009 |
|---|
| 4 |       | Aswin Sreedhar,
Sandip Kundu:
On linewidth-based yield analysis for nanometer lithography.
DATE 2009: 381-386 |
| 2008 |
|---|
| 3 | | Aswin Sreedhar,
Alodeep Sanyal,
Sandip Kundu:
On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits.
DATE 2008: 616-621 |
| 2 | | Aswin Sreedhar,
Sandip Kundu:
Modeling and analysis of non-rectangular transistors caused by lithographic distortions.
ICCD 2008: 444-449 |
| 2007 |
|---|
| 1 | | Aswin Sreedhar,
Sandip Kundu:
On modeling impact of sub-wavelength lithography on transistors.
ICCD 2007: 84-90 |
