Rudi Stans

	1993
3		Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker: Minimizing Test Time by Exploiting Parallelism in Macro Test. ITC 1993: 451-460
	1992
2		Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker: Macro Testability: The Results of Production Device Applications. ITC 1992: 232-241
	1989
1		Frans P. M. Beenker, Rob Dekker, Rudi Stans, Max Van der Star: A Testability Strategy for Silicon Compilers. ITC 1989: 660-669

Coauthor Index

1	Frans P. M. Beenker	[1] [2] [3]
2	Ben Bennetts (R. G. Bennetts)	[2]
3	Frank Bouwman	[2] [3]
4	Hans Bouwmeester	[3]
5	Rob Dekker	[1]
6	Steven Oostdijk	[2] [3]
7	Max Van der Star	[1]
8	Loek Thijssen	[3]