 | 2005 |
|---|
| 9 |       | Alberto Tosi,
Franco Stellari,
F. Zappa:
Innovative packaging technique for backside optical testing of wire-bonded chips.
Microelectronics Reliability 45(9-11): 1493-1498 (2005) |
| 8 | | Franco Stellari,
Peilin Song,
John Hryckowian,
Otto A. Torreiter,
Steve Wilson,
Philip Wu,
Alberto Tosi:
Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE).
Microelectronics Reliability 45(9-11): 1550-1553 (2005) |
| 2004 |
|---|
| 7 | | Peilin Song,
Franco Stellari,
Alan J. Weger,
Tian Xia:
A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current.
ITC 2004: 140-147 |
| 2003 |
|---|
| 6 | | Franco Stellari,
Peilin Song,
Moyra K. McManus,
Robert Gauthier,
Alan J. Weger,
Kiran V. Chatty,
Mujahid Muhammad,
Pia Sanda:
Optical and Electrical Testing of Latchup in I/O Interface Circuits.
ITC 2003: 236-245 |
| 5 | | Franco Stellari,
Peilin Song,
Moyra K. McManus,
Alan J. Weger,
Robert Gauthier,
Kiran V. Chatty,
Mujahid Muhammad,
Pia Sanda,
Philip Wu,
Steve Wilson:
Latchup Analysis Using Emission Microscopy.
Microelectronics Reliability 43(9-11): 1603-1608 (2003) |
| 4 | | Romain Desplats,
A. Eral,
Felix Beaudoin,
Philippe Perdu,
Alan J. Weger,
Moyra K. McManus,
Peilin Song,
Franco Stellari:
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Microelectronics Reliability 43(9-11): 1663-1668 (2003) |
| 3 | | Alberto Tosi,
Franco Stellari,
F. Zappa,
S. Cova:
Backside Flip-Chip testing by means of high-bandwidth luminescence detection.
Microelectronics Reliability 43(9-11): 1669-1674 (2003) |
| 2002 |
|---|
| 2 | | Franco Stellari,
Peilin Song,
James C. Tsang,
Moyra K. McManus,
Mark B. Ketchen:
Optical diagnosis of excess IDDQ in low power CMOS circuits.
Microelectronics Reliability 42(9-11): 1689-1694 (2002) |
| 2001 |
|---|
| 1 | | Franco Stellari,
F. Zappa,
S. Cova,
L. Vendrame:
Tools for contactless testing and simulation of CMOS circuits.
Microelectronics Reliability 41(11): 1801-1808 (2001) |
