Lauren M. Streb

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1992

4 Babur Mustafa Pulat, Lauren M. Streb: Position of Component Testing in Total Quality Management (TQM). ITC 1992: 362-366

3 W. David Ballew, Lauren M. Streb: Board-level boundary scan: regaining observability with an additional IC. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 68-75 (1992)

1989

2 W. David Ballew, Lauren M. Streb: Board-Level Boundary-Scan: Regaining Observability with an Additional IC. ITC 1989: 182-189

1988

1 W. David Ballew, Lauren M. Streb: Elimination of Incoming Test Based Upon In-Process Failure and Repair Costs. ITC 1988: 308-313

	1992
4		Babur Mustafa Pulat, Lauren M. Streb: Position of Component Testing in Total Quality Management (TQM). ITC 1992: 362-366
3		W. David Ballew, Lauren M. Streb: Board-level boundary scan: regaining observability with an additional IC. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 68-75 (1992)
	1989
2		W. David Ballew, Lauren M. Streb: Board-Level Boundary-Scan: Regaining Observability with an Additional IC. ITC 1989: 182-189
	1988
1		W. David Ballew, Lauren M. Streb: Elimination of Incoming Test Based Upon In-Process Failure and Repair Costs. ITC 1988: 308-313

Coauthor Index

1 W. David Ballew [1] [2] [3]

2 Babur Mustafa Pulat [4]

Colors in the list of coauthors