Stephen Y. H. Su

	1997
28		Stephen Y. H. Su, Rong Yao: Fault-Tolerant Array Processors Via Reconfiguration of Two-Level Redundancy Arrays. PDPTA 1997: 1633-1642
	1991
27		Stephen Y. H. Su, Michal Cutler, Mingshien Wang: Self-Diagnosis of Faelures in VLSI Tree Array Processors. IEEE Trans. Computers 40(11): 1252-1257 (1991)
	1989
26		Mingshien Wang, Michal Cutler, Stephen Y. H. Su: Reconfiguration of VLSI/WSI Mesh Array Processors with Two-Level Redundancy. IEEE Trans. Computers 38(4): 547-554 (1989)
	1988
25		Stephen Y. H. Su, Hede Ma: Fault Isolation in Grey Systems. ITC 1988: 54-63
24		Stephen Y. H. Su, Hede Ma: Designs for Diagnosability and Reliability in VLSI Systems. ITC 1988: 888-897
23		Li Shen, Stephen Y. H. Su: A Functional Testing Method for Microprocessors. IEEE Trans. Computers 37(10): 1288-1293 (1988)
	1986
22		Israel Koren, Zahava Koren, Stephen Y. H. Su: Analaysis of a Class of Recovery Procedures. IEEE Trans. Computers 35(8): 703-712 (1986)
	1985
21		Tonysheng Lin, Stephen Y. H. Su: VLSI Functional Test Pattern Generation: A Design and Implementation. ITC 1985: 922-929
20		Shiyi Xu, Stephen Y. H. Su: Detecting I/O and Internal Feedback Bridging Faults. IEEE Trans. Computers 34(6): 553-557 (1985)
19		Tonysheng Lin, Stephen Y. H. Su: The S-Algorithm: A Promising Solution for Systematic Functional Test Generation. IEEE Trans. on CAD of Integrated Circuits and Systems 4(3): 250-263 (1985)
	1984
18		Stephen Y. H. Su: IDAS: an integrated design automation system. AFIPS National Computer Conference 1984: 143-150
17		Li Shen, Stephen Y. H. Su: VLSI functional testing using critical path traces at hardware description language level. Fehlertolerierende Rechensysteme 1984: 364-379
16		Tonysheng Lin, Stephen Y. H. Su: Functional Test Generation of Digital LSI/VLSI Systems Using Machine Symbolic Execution Technique. ITC 1984: 660-668
	1983
15		Kewal K. Saluja, Li Shen, Stephen Y. H. Su: A Simplified Algorithm for Testing Microprocessors. ITC 1983: 668-675
	1982
14		Chi-Chang Liaw, Stephen Y. H. Su: A New Fault Model and Testing Technique for CMOS Devices. ITC 1982: 25-34
13		Yacoub M. El-Ziq, Stephen Y. H. Su: Fault Diagnosis of MOS Combinational Networks. IEEE Trans. Computers 31(2): 129-139 (1982)
	1981
12		Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya: State Diagram Approach for Functional Testing of Control Section. ITC 1981: 433-446
11		Stephen Y. H. Su, Yu-I Hsieh: Testing Functional Faults in Digital Systems Described by Register Transfer Language. ITC 1981: 447-457
10		Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya: Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. IEEE Trans. Computers 30(12): 989-995 (1981)
9		Yashwant K. Malaiya, Stephen Y. H. Su: Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults. IEEE Trans. Computers 30(8): 600-604 (1981)
	1980
8		Stephen Y. H. Su, Edgar DuCasse: A Hardware Redundancy Reconfiguration Scheme for Tolerating Multiple Module Failures. IEEE Trans. Computers 29(3): 254-258 (1980)
7		Mark G. Karpovsky, Stephen Y. H. Su: Detection and Location of Input and Feedback Bridging Faults Among Input and Output Lines. IEEE Trans. Computers 29(6): 523-527 (1980)
	1979
6		Israel Koren, Stephen Y. H. Su: Reliability Analysis of N-Modular Redundancy Systems with Intermittent and Permanent Faults. IEEE Trans. Computers 28(7): 514-520 (1979)
	1978
5		Yacoub M. El-Ziq, Stephen Y. H. Su: Computer-Aided Logic Design of Two-Level MOS Combinational Networks with Statistical Results. IEEE Trans. Computers 27(10): 911-923 (1978)
4		Stephen Y. H. Su, Israel Koren, Yashwant K. Malaiya: A Continous-Parameter Markov Model and Detection Procedures for Intermittent Faults. IEEE Trans. Computers 27(6): 567-570 (1978)
	1977
3		Stephen Y. H. Su, Richard J. Spillman: An overview of fault-tolerant digital system architecture. AFIPS National Computer Conference 1977: 19-26
2		Richard J. Spillman, Stephen Y. H. Su: Detection of Single, Stuck-Type Faulures in Multivalued Combinational Networks. IEEE Trans. Computers 26(12): 1242-1251 (1977)
	1976
1		Melvin A. Breuer, Shih-Jeh Chang, Stephen Y. H. Su: Identification of Multiple Stuck-Type Faults in Combinational Networks. IEEE Trans. Computers 25(1): 44-54 (1976)

Coauthor Index

1	Melvin A. Breuer	[1]
2	Shih-Jeh Chang	[1]
3	Michal Cutler	[26] [27]
4	Edgar DuCasse	[8]
5	Yacoub M. El-Ziq	[5] [13]
6	Yu-I Hsieh	[11]
7	Mark G. Karpovsky	[7]
8	Israel Koren	[4] [6] [22]
9	Zahava Koren	[22]
10	Chi-Chang Liaw	[10] [12] [14]
11	Tonysheng Lin	[16] [19] [21]
12	Hede Ma	[24] [25]
13	Yashwant K. Malaiya	[4] [9] [10] [12]
14	Kewal K. Saluja	[15]
15	Li Shen	[15] [17] [23]
16	Richard J. Spillman	[2] [3]
17	Mingshien Wang	[26] [27]
18	Shiyi Xu	[20]
19	Rong Yao	[28]

Colors in the list of coauthors