John S. Suehle

	2005
2		John S. Suehle, B. Zhu, Y. Chen, Joseph B. Bernstein: Detailed study and projection of hard breakdown evolution in ultra-thin gate oxides. Microelectronics Reliability 45(3-4): 419-426 (2005)
	2002
1		John S. Suehle: Ultra-thin Gate Oxide Reliability and Implications for Design (Tutorial Abstract). ISQED 2002: 9

Coauthor Index

1	Joseph B. Bernstein	[2]
2	Y. Chen	[2]
3	B. Zhu	[2]