Shigeru Sugamori

	1983
2		Shigeru Sugamori, Kunio Takeuchi, Hiromi Maruyama, Shinpei Kamata: High-Fidelity Device Tester Interface. ITC 1983: 371-378
	1981
1		Shigeru Sugamori, Kenji Yoshida, Hiromi Maruyama, Shinpei Kamata, Tsuneta Sudo: Analysis and Definition of Overall Timing Accuracy in VLSI Test System. ITC 1981: 143-153

Coauthor Index

1	Shinpei Kamata	[1] [2]
2	Hiromi Maruyama	[1] [2]
3	Tsuneta Sudo	[1]
4	Kunio Takeuchi	[2]
5	Kenji Yoshida	[1]