Stephen K. Sunter

	2008
22		Stephen K. Sunter, Aubin Roy: Noise-Insensitive Digital BIST for any PLL or DLL. J. Electronic Testing 24(5): 461-472 (2008)
	2007
21		Stephen K. Sunter, Aubin Roy: Purely Digital BIST for Any PLL or DLL. European Test Symposium 2007: 185-192
	2005
20		Bozena Kaminska, Stephen K. Sunter, Salvador Mir: Analog and mixed signal test techniques for SOC development. Microelectronics Journal 36(12): 1063 (2005)
	2004
19		Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts: Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE 2004: 1184-1191
18		Stephen K. Sunter, Aubin Roy, Jean-Francois Cote: An Automated, Complete, Structural Test Solution for SERDES. ITC 2004: 95-104
17		Stephen K. Sunter, Aubin Roy: On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz. IEEE Design & Test of Computers 21(4): 314-321 (2004)
	2003
16		Stephen K. Sunter: Testing High Frequency ADCs and DACs with a Low Frequency Analog Bus. ITC 2003: 228-235
	2002
15		Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello: High Accuracy Stimulus Generation for A/D Converter BIST. ITC 2002: 1031-1039
14		Stephen K. Sunter: IC Mixed-Signal BIST: Separating Facts from Fiction. ITC 2002: 1205
13		Stephen K. Sunter, Benoit Nadeau-Dostie: Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing Digital IC Testing Cost. ITC 2002: 446-455
	2001
12		Stephen K. Sunter, Charles McDonald, Givargis Danialy: Contactless digital testing of IC pin leakage currents. ITC 2001: 204-210
11		Stephen K. Sunter, Ken Filliter, Joe Woo, Pat McHugh: A general purpose 1149.4 IC with HF analog test capabilities. ITC 2001: 38-45
	2000
10		T. W. Williams, Stephen K. Sunter: How Should Fault Coverage Be Defined? VTS 2000: 325-328
	1999
9		Stephen K. Sunter, Aubin Roy: BIST for phase-locked loops in digital applications. ITC 1999: 532-540
8		Stephen K. Sunter, Naveena Nagi: Test Metrics for Analog Parametric Faults. VTS 1999: 226-235
7		Stephen K. Sunter: Analog, digital, and mixed-signal people. IEEE Design & Test of Computers 16(3): 128- (1999)
	1998
6		Stephen K. Sunter: BIST vs. ATE: need a different vehicle? ITC 1998: 1148
	1997
5		Stephen K. Sunter, Naveena Nagi: A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST. ITC 1997: 389-395
4		Stephen K. Sunter: P1149.4-Problem or Solution for Mixed-Signal IC Design? ITC 1997: 625
	1996
3		Karim Arabi, Bozena Kaminska, Stephen K. Sunter: Design for testability of integrated operational amplifiers using oscillation-test strategy. ICCD 1996: 40-45
	1995
2		Stephen K. Sunter: The P1149.4 Mixed Signal Test Bus: Costs and Benefits. ITC 1995: 444-450
1		Stephen K. Sunter: A low cost 100 MHz analog test bus. VTS 1995: 60-65

Coauthor Index

1	Davide Appello	[15]
2	Karim Arabi	[3]
3	Carl Barnhart	[19]
4	Ben Bennetts (R. G. Bennetts)	[19]
5	Dave Bonnett	[19]
6	Jean-Francois Cote	[18]
7	Adam Cron	[19]
8	Givargis Danialy	[12]
9	Bill Eklow (William Eklow)	[19]
10	Ken Filliter	[11]
11	Alessandra Fudoli	[15]
12	Neil Jacobson	[19]
13	Bozena Kaminska	[3] [20]
14	Charles McDonald	[12]
15	Pat McHugh	[11]
16	Salvador Mir	[20]
17	Benoit Nadeau-Dostie	[13]
18	Naveena Nagi	[5] [8]
19	Adam Osseiran	[19]
20	Aubin Roy	[9] [15] [17] [18] [21] [22]
21	T. W. Williams	[10]
22	Joe Woo	[11]

Colors in the list of coauthors