Ryuichi Takagi

	1989
2		Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi: A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability. ITC 1989: 558-566
	1985
1		Ryozou Yoshino, Ryuichi Takagi: Custom VLSI Test System. ITC 1985: 431-437

Coauthor Index

1	Yoshihiko Hayashi	[2]
2	Shuji Kikuchi	[2]
3	Takashi Matsumoto	[2]
4	Ryozou Yoshino	[1] [2]