| 2001 | ||
|---|---|---|
| 2 | Reza Aghaeizadeh Zoroofi, Hisashi Taketani, Shinichi Tamura, Yoshinobu Sato, Kazuma Sekiya: Automated inspection of IC wafer contamination. Pattern Recognition 34(6): 1307-1317 (2001) | |
| 1993 | ||
| 1 | Eung-Kyeu Kim, Jian-Tong Wu, Shinichi Tamura, Yoshinobu Sato, Robert Close, Hisashi Taketani, Hideo Kawai, Masahiro Inoue, Keiro Ono: Comparison of Neural Network and k-NN Classification Methods in Vowel and Patellar Subluxation Image Recognitions. IJPRAI 7(4): 775-782 (1993) | |
| 1 | Robert Close | [1] |
| 2 | Masahiro Inoue | [1] |
| 3 | Hideo Kawai | [1] |
| 4 | Eung-Kyeu Kim | [1] |
| 5 | Keiro Ono | [1] |
| 6 | Yoshinobu Sato | [1] [2] |
| 7 | Kazuma Sekiya | [2] |
| 8 | Shinichi Tamura | [1] [2] |
| 9 | Jian-Tong Wu | [1] |
| 10 | Reza Aghaeizadeh Zoroofi | [2] |