Michael Talmor

	2006
2		Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor: Electronic circuit reliability modeling. Microelectronics Reliability 46(12): 1957-1979 (2006)
	2005
1		Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein: Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. ISQED 2005: 382-389

Coauthor Index

1	Joseph B. Bernstein	[1] [2]
2	Z. Gur	[1]
3	Moshe Gurfinkel	[2]
4	Bing Huang	[1]
5	Xiaojun Li	[1] [2]
6	J. Qin	[1]
7	Yoram Shapira	[2]
8	Jörg Walters	[2]
9	X. Zhang	[1]