Mohammad Tehranipoor

2008
33	EE	Jeremy Lee, Sumit Narayan, Mike Kapralos, Mohammad Tehranipoor: Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation. DATE 2008: 1172-1177
32	EE	Jeremy Lee, Mohammad Tehranipoor: LS-TDF: Low-Switching Transition Delay Fault Pattern Generation. VTS 2008: 227-232
31	EE	Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor: Test-Pattern Grading and Pattern Selection for Small-Delay Defects. VTS 2008: 233-239
30	EE	Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed: Low-Transition Test Pattern Generation for BIST-Based Applications. IEEE Trans. Computers 57(3): 303-315 (2008)
29	EE	Reza M. Rad, Mohammad Tehranipoor: SCT: A novel approach for testing and configuring nanoscale devices. JETC 4(3): (2008)
2007
28	EE	Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design. DAC 2007: 533-538
27	EE	Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Supply Voltage Noise Aware ATPG for Transition Delay Faults. VTS 2007: 179-186
26	EE	Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ravikumar: A critical-path-aware partial gating approach for test power reduction. ACM Trans. Design Autom. Electr. Syst. 12(2): (2007)
25	EE	Mohammad Tehranipoor, Kenneth M. Butler: Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs. IEEE Design & Test of Computers 24(3): 214-215 (2007)
24	EE	Jeremy Lee, Mohammad Tehranipoor, Chintan Patel, Jim Plusquellic: Securing Designs against Scan-Based Side-Channel Attacks. IEEE Trans. Dependable Sec. Comput. 4(4): 325-336 (2007)
23	EE	Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler: Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 896-906 (2007)
22	EE	Mohammad Tehranipoor, Reza M. Rad: Built-In Self-Test and Recovery Procedures for Molecular Electronics-Based Nanofabrics. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 943-958 (2007)
21	EE	Mohammad Tehranipoor: Guest Editorial. J. Electronic Testing 23(2-3): 115-116 (2007)
20	EE	Reza M. Rad, Mohammad Tehranipoor: Evaluating area and performance of hybrid FPGAs with nanoscale clusters and CMOS routing. JETC 3(3): (2007)
2006
19	EE	Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Timing-based delay test for screening small delay defects. DAC 2006: 320-325
18	EE	Reza M. Rad, Mohammad Tehranipoor: A new hybrid FPGA with nanoscale clusters and CMOS routing. DAC 2006: 727-730
17	EE	Reza M. Rad, Mohammad Tehranipoor: A Reconfiguration-based Defect Tolerance Method for Nanoscale Devices. DFT 2006: 107-118
16	EE	Mohammad Tehranipoor, Reza M. Rad: Fine-grained island style architecture for molecular electronic devices. FPGA 2006: 226
15	EE	Mohammad Tehranipoor, Reza M. Rad: Test and recovery for fine-grained nanoscale architectures. FPGA 2006: 226
14	EE	Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: A novel framework for faster-than-at-speed delay test considering IR-drop effects. ICCAD 2006: 198-203
13	EE	Kee Sup Kim, Mohammad Tehranipoor: Session Abstract. VTS 2006: 292-293
12	EE	Reza M. Rad, Mohammad Tehranipoor: SCT: An Approach For Testing and Configuring Nanoscale Devices. VTS 2006: 370-377
11	EE	Jeremy Lee, Mohammad Tehranipoor, Jim Plusquellic: A Low-Cost Solution for Protecting IPs Against Scan-Based Side-Channel Attacks. VTS 2006: 94-99
10	EE	Jim Plusquellic, Dhruva Acharyya, Abhishek Singh, Mohammad Tehranipoor, Chintan Patel: Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method. IEEE Design & Test of Computers 23(4): 278-293 (2006)
9	EE	Nisar Ahmed, Mohammad Tehranipoor: Improving Transition Delay Test Using a Hybrid Method. IEEE Design & Test of Computers 23(5): 402-412 (2006)
2005
8	EE	Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed: Low Transition LFSR for BIST-Based Applications. Asian Test Symposium 2005: 138-143
7	EE	Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ravikumar: Partial Gating Optimization for Power Reduction During Test Application. Asian Test Symposium 2005: 242-247
6	EE	Nisar Ahmed, Mohammad Tehranipoor: Improving Transition Delay Fault Coverage Using Hybrid Scan-Based Technique. DFT 2005: 187-198
5	EE	Mohammad Tehranipoor: Defect Tolerance for Molecular Electronics-Based NanoFabrics Using Built-In Self-Test Procedure. DFT 2005: 305-313
4	EE	Jeremy Lee, Mohammad Tehranipoor, Chintan Patel, Jim Plusquellic: Securing Scan Design Using Lock and Key Technique. DFT 2005: 51-62
3	EE	Nisar Ahmed, C. P. Ravikumar, Mohammad Tehranipoor, Jim Plusquellic: At-Speed Transition Fault Testing With Low Speed Scan Enable. VTS 2005: 42-47
2	EE	Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed: Pattern Generation and Estimation for Power Supply Noise Analysis. VTS 2005: 439-444
1	EE	Mohammad Tehranipoor, Mehrdad Nourani, Krishnendu Chakrabarty: Nine-coded compression technique for testing embedded cores in SoCs. IEEE Trans. VLSI Syst. 13(6): 719-731 (2005)

Coauthor Index

1	Dhruva Acharyya	[10]
2	Nisar Ahmed	[2] [3] [6] [8] [9] [14] [19] [23] [27] [28] [30]
3	Kenneth M. Butler	[23] [25]
4	Krishnendu Chakrabarty	[1] [31]
5	Mohammed ElShoukry	[7] [26]
6	Vinay Jayaram	[14] [19] [27] [28]
7	Mike Kapralos	[33]
8	Kee Sup Kim	[13]
9	Jeremy Lee	[4] [11] [24] [32] [33]
10	Sumit Narayan	[33]
11	Mehrdad Nourani	[1] [2] [8] [30]
12	Chintan Patel	[4] [10] [24]
13	James F. Plusquellic (Jim Plusquellic)	[3] [4] [10] [11] [24]
14	Reza M. Rad	[12] [15] [16] [17] [18] [20] [22] [29]
15	C. P. Ravikumar	[3] [7] [23] [26]
16	Abhishek Singh	[10]
17	Mahmut Yilmaz	[31]

Colors in the list of coauthors