Kenta Terashima

	2008
2		Kohei Miyase, Kenta Terashima, Xiaoqing Wen, Seiji Kajihara, Sudhakar M. Reddy: On Detection of Bridge Defects with Stuck-at Tests. IEICE Transactions 91-D(3): 683-689 (2008)
	2005
1		Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy: On Improving Defect Coverage of Stuck-at Fault Tests. Asian Test Symposium 2005: 216-223

Coauthor Index

1	Seiji Kajihara	[1] [2]
2	Kohei Miyase	[1] [2]
3	Sudhakar M. Reddy	[1] [2]
4	Xiaoqing Wen	[1] [2]