Laila Terkawi

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2007

2 Mohammad Gh. Mohammad, Laila Terkawi: Techniques for Disturb Fault Collapsing. J. Electronic Testing 23(4): 363-368 (2007)

2006

1 Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasman: A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity. VLSI Design 2006: 100-107

	2007
2		Mohammad Gh. Mohammad, Laila Terkawi: Techniques for Disturb Fault Collapsing. J. Electronic Testing 23(4): 363-368 (2007)
	2006
1		Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasman: A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity. VLSI Design 2006: 100-107

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