R. Tilgner

	2006
3		A. Altes, R. Tilgner, W. Walter: Numerical evaluation of miniaturized resistive probe for quantitative thermal near-field microscopy of thermal conductivity. Microelectronics Reliability 46(9-11): 1525-1529 (2006)
	2003
2		P. Rajamand, R. Tilgner, R. Schmidt, J. Baumann, P. Klofac, M. Rothenfusser: Investigation of delaminations during thermal stress: scanning acoustic microscopy covering low and high temperatures. Microelectronics Reliability 43(9-11): 1815-1820 (2003)
	1979
1		R. Tilgner, Achim von Brandt, Friedrich M. Wahl: Erfahrungen mit Relaxationsverfahren zur Kantendetektion. DAGM-Symposium 1979: 129-136

Coauthor Index

1	A. Altes	[3]
2	J. Baumann	[2]
3	Achim von Brandt	[1]
4	P. Klofac	[2]
5	P. Rajamand	[2]
6	M. Rothenfusser	[2]
7	R. Schmidt	[2]
8	Friedrich M. Wahl	[1]
9	W. Walter	[3]

Colors in the list of coauthors