 | 2009 |
|---|
| 38 |       | Du-Ming Tsai,
Shia-Chih Lai:
Independent Component Analysis-Based Background Subtraction for Indoor Surveillance.
IEEE Transactions on Image Processing 18(1): 158-167 (2009) |
| 37 | | Du-Ming Tsai,
Su-Ta Chuang:
1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations.
Mach. Vis. Appl. 20(6): 423-434 (2009) |
| 2008 |
|---|
| 36 | | Shin-Min Chao,
Du-Ming Tsai:
An anisotropic diffusion-based defect detection for low-contrast glass substrates.
Image Vision Comput. 26(2): 187-200 (2008) |
| 35 | | Chi-Jie Lu,
Du-Ming Tsai:
Independent component analysis-based defect detection in patterned liquid crystal display surfaces.
Image Vision Comput. 26(7): 955-970 (2008) |
| 34 | | Du-Ming Tsai,
Shia-Chih Lai:
Defect detection in periodically patterned surfaces using independent component analysis.
Pattern Recognition 41(9): 2812-2832 (2008) |
| 33 | | Du-Ming Tsai,
Wei-Yao Chiu:
Motion detection using Fourier image reconstruction.
Pattern Recognition Letters 29(16): 2145-2155 (2008) |
| 2007 |
|---|
| 32 | | Du-Ming Tsai,
Chih-Chia Kuo:
Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction.
Mach. Vis. Appl. 18(6): 383-400 (2007) |
| 2006 |
|---|
| 31 | | Shin-Min Chao,
Du-Ming Tsai,
Yan-Hsin Tseng,
Yuan-Ruei Jhang:
Defect detection in low-contrast glass substrates using anisotropic diffusion.
ICPR (1) 2006: 654-657 |
| 30 | | Du-Ming Tsai,
Yan-Hsin Tseng,
Shin-Min Chao,
Chao-Hsuan Yen:
Independent component analysis based filter design for defect detection in low-contrast textured images.
ICPR (2) 2006: 231-234 |
| 29 | | Du-Ming Tsai,
Ping-Chieh Lin,
Chi-Jie Lu:
An independent component analysis-based filter design for defect detection in low-contrast surface images.
Pattern Recognition 39(9): 1679-1694 (2006) |
| 28 | | Shin-Min Chao,
Du-Ming Tsai:
Astronomical image restoration using an improved anisotropic diffusion.
Pattern Recognition Letters 27(5): 335-344 (2006) |
| 2005 |
|---|
| 27 | | Du-Ming Tsai,
Ron-Hwa Yang:
An eigenvalue-based similarity measure and its application in defect detection.
Image Vision Comput. 23(12): 1094-1101 (2005) |
| 26 | | Du-Ming Tsai,
Shin-Min Chao:
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures.
Image Vision Comput. 23(3): 325-338 (2005) |
| 25 | | Du-Ming Tsai,
Cheng-Hsiang Yang:
A quantile-quantile plot based pattern matching for defect detection.
Pattern Recognition Letters 26(13): 1949-1962 (2005) |
| 24 | | Erwie Zahara,
Shu-Kai S. Fan,
Du-Ming Tsai:
Optimal multi-thresholding using a hybrid optimization approach.
Pattern Recognition Letters 26(8): 1082-1095 (2005) |
| 2003 |
|---|
| 23 | | Du-Ming Tsai,
Tse-Yun Huang:
Automated surface inspection for statistical textures.
Image Vision Comput. 21(4): 307-323 (2003) |
| 22 | | Du-Ming Tsai,
Cheng-Huei Chiang:
Automatic band selection for wavelet reconstruction in the application of defect detection.
Image Vision Comput. 21(5): 413-431 (2003) |
| 21 | | Du-Ming Tsai,
Ya-Hui Tsai:
Defect detection in textured surfaces using color ring-projection correlation.
Mach. Vis. Appl. 13(4): 194-200 (2003) |
| 20 | | Du-Ming Tsai,
Chien-Ta Lin,
Jeng-Fung Chen:
The evaluation of normalized cross correlations for defect detection.
Pattern Recognition Letters 24(15): 2525-2535 (2003) |
| 19 | | Du-Ming Tsai,
Chien-Ta Lin:
Fast normalized cross correlation for defect detection.
Pattern Recognition Letters 24(15): 2625-2631 (2003) |
| 2002 |
|---|
| 18 | | Du-Ming Tsai,
Ya-Hui Tsai:
Rotation-invariant pattern matching with color ring-projection.
Pattern Recognition 35(1): 131-141 (2002) |
| 17 | | Du-Ming Tsai,
Cheng-Huei Chiang:
Rotation-invariant pattern matching using wavelet decomposition.
Pattern Recognition Letters 23(1-3): 191-201 (2002) |
| 2001 |
|---|
| 16 | | Du-Ming Tsai,
Song-Kuaw Wu,
Mu-Chen Chen:
Optimal Gabor filter design for texture segmentation using stochastic optimization.
Image Vision Comput. 19(5): 299-316 (2001) |
| 15 | | Du-Ming Tsai,
Bo Hsiao:
Automatic surface inspection using wavelet reconstruction.
Pattern Recognition 34(6): 1285-1305 (2001) |
| 1999 |
|---|
| 14 | | Du-Ming Tsai,
C.-Y. Hsieh:
Automated surface inspection for directional textures.
Image Vision Comput. 18(1): 49-62 (1999) |
| 13 | | Du-Ming Tsai,
Chi-Fong Tseng:
Surface roughness classification for castings.
Pattern Recognition 32(3): 389-405 (1999) |
| 12 | | Du-Ming Tsai,
H.-T. Hou,
H.-J. Su:
Boundary-based corner detection using eigenvalues of covariance matrices.
Pattern Recognition Letters 20(1): 31-40 (1999) |
| 11 | | Mu-Chen Chen,
Du-Ming Tsai,
Hsien-Yu Tseng:
A stochastic optimization approach for roundness measurement.
Pattern Recognition Letters 20(7): 707-719 (1999) |
| 1998 |
|---|
| 10 | | Du-Ming Tsai,
Chin-Tun Lin:
A moment-preserving approach for depth from defocus.
Pattern Recognition 31(5): 551-560 (1998) |
| 9 | | Du-Ming Tsai,
Hu-Jong Wang:
Segmenting focused objects in complex visual images.
Pattern Recognition Letters 19(10): 929-940 (1998) |
| 1997 |
|---|
| 8 | | Du-Ming Tsai:
An improved generalized Hough transform for the recognition of overlapping objects.
Image Vision Comput. 15(12): 877-888 (1997) |
| 7 | | Du-Ming Tsai:
Boundary-based corner detection using neural networks.
Pattern Recognition 30(1): 85-97 (1997) |
| 1996 |
|---|
| 6 | | Du-Ming Tsai,
Tsai Ray-Yuan:
Use neural networks to determine matching order for recognizing overlapping objects.
Pattern Recognition Letters 17(10): 1077-1088 (1996) |
| 1995 |
|---|
| 5 | | Du-Ming Tsai:
A three-dimensional machine-vision approach for automatic robot programming.
Journal of Intelligent and Robotic Systems 12(1): 23-48 (1995) |
| 4 | | Du-Ming Tsai,
Ming-fong Chen:
Object recognition by a linear weight classifier.
Pattern Recognition Letters 16(6): 591-600 (1995) |
| 3 | | Du-Ming Tsai:
A fast thresholding selection procedure for multimodal and unimodal histograms.
Pattern Recognition Letters 16(6): 653-666 (1995) |
| 1994 |
|---|
| 2 | | Du-Ming Tsai,
Ming-fong Chen:
Curve fitting approach for tangent angle and curvature measurements.
Pattern Recognition 27(5): 699-711 (1994) |
| 1992 |
|---|
| 1 | | Du-Ming Tsai,
Ying-Hsiung Chen:
A fast histogram-clustering approach for multi-level thresholding.
Pattern Recognition Letters 13(4): 245-252 (1992) |
