Chao-Wen Tzeng

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2009

3 Chao-Wen Tzeng, Shi-Yu Huang: QC-Fill: An X-Fill method for quick-and-cool scan test. DATE 2009: 1142-1147

2008

2 Chao-Wen Tzeng, Jheng-Syun Yang, Shi-Yu Huang: A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques. ACM Trans. Design Autom. Electr. Syst. 13(1): (2008)

1 Chao-Wen Tzeng, Shi-Yu Huang: UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting. IEEE Design & Test of Computers 25(2): 132-140 (2008)

	2009
3		Chao-Wen Tzeng, Shi-Yu Huang: QC-Fill: An X-Fill method for quick-and-cool scan test. DATE 2009: 1142-1147
	2008
2		Chao-Wen Tzeng, Jheng-Syun Yang, Shi-Yu Huang: A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques. ACM Trans. Design Autom. Electr. Syst. 13(1): (2008)
1		Chao-Wen Tzeng, Shi-Yu Huang: UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting. IEEE Design & Test of Computers 25(2): 132-140 (2008)

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