| 2009 | ||
|---|---|---|
| 47 | Tobias Koal, Daniel Scheit, Heinrich Theodor Vierhaus: A scheme of logic self repair including local interconnects. DDECS 2009: 8-11 | |
| 2008 | ||
| 46 | Heinrich Theodor Vierhaus, René Kothe: Embedded Diagnostic Logic Test Exploiting Regularity. DSD 2008: 873-879 | |
| 45 | Silvio Misera, Heinrich Theodor Vierhaus, André Sieber: Simulated fault injections and their acceleration in SystemC. Microprocessors and Microsystems - Embedded Hardware Design 32(5-6): 270-278 (2008) | |
| 2007 | ||
| 44 | René Kothe, Heinrich Theodor Vierhaus: Flip-Flops and Scan-Path Elements for Nanoelectronics. DDECS 2007: 307-312 | |
| 43 | Heinrich Theodor Vierhaus, Helmut Rossmann, Silvio Misera: Timing- / Power-Optimization for Digital Logic Based on Standard Cells. DSD 2007: 303-306 | |
| 42 | Silvio Misera, Heinrich Theodor Vierhaus, André Sieber: Fault Injection Techniques and their Accelerated Simulation in SystemC. DSD 2007: 587-595 | |
| 41 | R. Frost Brandenburg, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus: A Configurable Modular Test Processor and Scan Controller Architecture. IOLTS 2007: 277-284 | |
| 2006 | ||
| 40 | Christian Galke, René Kothe, Heinrich Theodor Vierhaus: Logic Self Repair. ARCS Workshops 2006: 36-44 | |
| 39 | Udo Krautz, Matthias Pflanz, Christian Jacobi, Hans-Werner Tast, Kai Weber, Heinrich Theodor Vierhaus: Evaluating coverage of error detection logic for soft errors using formal methods. DATE 2006: 176-181 | |
| 38 | René Kothe, Christian Galke, S. Schultke, H. Froeschke, S. Gaede, Heinrich Theodor Vierhaus: Hardware/Software Based Hierarchical Self Test for SoCs. DDECS 2006: 159-160 | |
| 37 | René Kothe, Heinrich Theodor Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube: Embedded Self Repair by Transistor and Gate Level Reconfiguration. DDECS 2006: 210-215 | |
| 36 | Silvio Misera, Heinrich Theodor Vierhaus, Lars Breitenfeld, André Sieber: A Mixed Language Fault Simulation of VHDL and SystemC. DSD 2006: 275-279 | |
| 35 | Christian Galke, U. Gätzschmann, Heinrich Theodor Vierhaus: Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes. DSD 2006: 433-438 | |
| 34 | Christian Galke, René Kothe, S. Schultke, K. Winkler, J. Honko, Heinrich Theodor Vierhaus: Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. IOLTS 2006: 181-182 | |
| 33 | S. Habermann, René Kothe, Heinrich Theodor Vierhaus: Built-in Self Repair by Reconfiguration of FPGAs. IOLTS 2006: 187-188 | |
| 2005 | ||
| 32 | Heinrich Theodor Vierhaus, Helmut Rossmann: Power-/Timing - Optimierung für Zellen-basierte Digitalschaltungen in Submikron-Technologien. GI Jahrestagung (1) 2005: 339-343 | |
| 31 | René Kothe, Christian Galke, Heinrich Theodor Vierhaus: A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features. IOLTS 2005: 241-246 | |
| 30 | Marcin Gomulkiewicz, Miroslaw Kutylowski, Heinrich Theodor Vierhaus, Pawel Wlaz: Synchronization Fault Cryptanalysis for Breaking A5/1. WEA 2005: 415-427 | |
| 2004 | ||
| 29 | Claudia Kretzschmar, Christian Galke, Heinrich Theodor Vierhaus: A Hierarchical Self Test Scheme for SoCs. IOLTS 2004: 37-44 | |
| 28 | Silvio Misera, Heinrich Theodor Vierhaus: FIT - A Parallel Hierarchical Fault Simulation Environment. PARELEC 2004: 289-294 | |
| 2003 | ||
| 27 | Matthias Pflanz, Heinrich Theodor Vierhaus: Control Signal Protection For High Performance Processors. IOLTS 2003: 173- | |
| 26 | Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus: Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip. IOLTS 2003: 183- | |
| 25 | Matthias Pflanz, K. Walther, Christian Galke, Heinrich Theodor Vierhaus: On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check. J. Electronic Testing 19(5): 501-510 (2003) | |
| 2002 | ||
| 24 | Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus: A Test Processor Concept for Systems-on-a-Chip. ICCD 2002: 210- | |
| 23 | Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus: On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures. IOLTW 2002: 178 | |
| 22 | Matthias Pflanz, K. Walther, Christian Galke, Heinrich Theodor Vierhaus: On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check. IOLTW 2002: 69-73 | |
| 2001 | ||
| 21 | C. Rousselle, Matthias Pflanz, A. Behling, T. Mohaupt, Heinrich Theodor Vierhaus: A register-transfer-level fault simulator for permanent and transient faults in embedded processors. DATE 2001: 811 | |
| 20 | Matthias Pflanz, K. Walther, Heinrich Theodor Vierhaus: On-line Error Detection Techniques for Dependable Embedded Processors with High Complexity. IOLTW 2001: 51-53 | |
| 19 | Matthias Pflanz, Heinrich Theodor Vierhaus: Online Check and Recovery Techniques for Dependable Embedded Processors. IEEE Micro 21(5): 24-40 (2001) | |
| 1999 | ||
| 18 | Matthias Pflanz, Heinrich Theodor Vierhaus, F. Pompsch: An efficient on-line-test and back-up scheme for embedded processors. ITC 1999: 964-972 | |
| 17 | Fulvio Corno, Uwe Gläser, Paolo Prinetto, Matteo Sonza Reorda, Heinrich Theodor Vierhaus, Massimo Violante: SymFony: a hybrid topological-symbolic ATPG exploiting RT-level information. IEEE Trans. on CAD of Integrated Circuits and Systems 18(2): 191-202 (1999) | |
| 1997 | ||
| 16 | H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation. Great Lakes Symposium on VLSI 1997: 112-117 | |
| 15 | H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: A Parallel Approach Solving the Test Generation Problem for Synchronous Sequential Circuits. PARCO 1997: 549-556 | |
| 14 | Uwe Hübner, Heinrich Theodor Vierhaus, Raul Camposano: Partitioning and analysis of static digital CMOS circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 16(11): 1292-1310 (1997) | |
| 1996 | ||
| 13 | Jörg Wilberg, A. Kuth, Raul Camposano, Wolfgang Rosenstiel, Heinrich Theodor Vierhaus: A Design Exploration Environment. Great Lakes Symposium on VLSI 1996: 77-80 | |
| 12 | H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: Automatic Test Pattern Generation with Optimal Load Balancing. PVM 1996: 205-212 | |
| 11 | Uwe Gläser, Heinrich Theodor Vierhaus: Mixed level test generation for synchronous sequential circuits using the FOGBUSTER algorithm. IEEE Trans. on CAD of Integrated Circuits and Systems 15(4): 410-423 (1996) | |
| 1995 | ||
| 10 | Uwe Gläser, Heinrich Theodor Vierhaus: FOGBUSTER: an efficient algorithm for sequential test generation. EURO-DAC 1995: 230-235 | |
| 9 | Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda, Uwe Gläser, Heinrich Theodor Vierhaus: Improving topological ATPG with symbolic techniques. VTS 1995: 338-343 | |
| 1994 | ||
| 8 | Michel Langevin, Eduard Cerny, Jörg Wilberg, Heinrich Theodor Vierhaus: Local microcode generation in system design. Code Generation for Embedded Processors 1994: 171-187 | |
| 7 | Uwe Gläser, Heinrich Theodor Vierhaus, M. Kley, A. Wiederhold: Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation. ICCAD 1994: 36-39 | |
| 6 | R. Wolber, Uwe Gläser, Heinrich Theodor Vierhaus: Testability Analysis for Test Generation in Synchronous Sequential Circuits. ICCD 1994: 350-353 | |
| 1993 | ||
| 5 | Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser: CMOS Bridges and Resistive Transistor Faults: IDDQ versus Delay Effects. ITC 1993: 83-91 | |
| 4 | Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser, Raul Camposano: Fault behavior and testability of asynchronous CMOS circuits. Microprocessing and Microprogramming 38(1-5): 223-228 (1993) | |
| 1992 | ||
| 3 | Uwe Hübner, Heinrich Theodor Vierhaus: Efficient partitioning and analysis of digital CMOS-circuits. ICCAD 1992: 280-283 | |
| 2 | Ursula Westerholz, Heinrich Theodor Vierhaus: Library Mapping of CMOS-Switch-Level-Circuits by Extraction of Isomorphic Subgraphs. ICCD 1992: 472-475 | |
| 1 | Uwe Gläser, Uwe Hübner, Heinrich Theodor Vierhaus: Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects. ITC 1992: 21-29 | |