| 2005 | ||
|---|---|---|
| 2 | G. Ghidini, C. Capolupo, G. Giusto, A. Sebastiani, B. Stragliati, M. Vitali: Tunnel oxide degradation under pulsed stress. Microelectronics Reliability 45(9-11): 1337-1342 (2005) | |
| 1982 | ||
| 1 | Colette Rolland, M. Vitali: Transactions Modelling In Distributed Environments. ICDCS 1982: 2-6 | |
| 1 | C. Capolupo | [2] |
| 2 | G. Ghidini | [2] |
| 3 | G. Giusto | [2] |
| 4 | Colette Rolland | [1] |
| 5 | A. Sebastiani | [2] |
| 6 | B. Stragliati | [2] |