| 2009 | ||
|---|---|---|
| 56 | Matthan Caan, Caroline Sage, Maaike van der Graaf, Cornelis A. Grimbergen, Stefan Sunaert, Lucas J. van Vliet, Frans Vos: Dual Tensor Atlas Generation Based on a Cohort of Coregistered non-HARDI Datasets. MICCAI (1) 2009: 869-876 | |
| 55 | Vincent Frans van Ravesteijn, Frans M. Vos, Lucas J. van Vliet: Recognition of Protruding Objects in Highly Structured Surroundings by Structural Inference. SCIA 2009: 41-50 | |
| 2008 | ||
| 54 | Adam W. M. van Eekeren, Klamer Schutte, Lucas J. van Vliet: Super-Resolution on small moving objects. ICIP 2008: 1248-1251 | |
| 53 | Vincent Frans van Ravesteijn, Frans M. Vos, Iwo Serlie, Roel Truyen, Lucas J. van Vliet: Thin layer tissue classification for electronic cleansing of CT colonography data. ICPR 2008: 1-5 | |
| 52 | Matthan Caan, Lucas J. van Vliet, Charles B. L. M. Majoie, Eline Aukema, Kees Grimbergen, Frans Vos: Spatial Consistency in 3D Tract-Based Clustering Statistics. MICCAI (1) 2008: 535-542 | |
| 2007 | ||
| 51 | Frank G. A. Faas, Lucas J. van Vliet: A Crossing Detector Based on the Structure Tensor. ACIVS 2007: 212-220 | |
| 50 | Frank G. A. Faas, Lucas J. van Vliet: Junction Detection and Multi-orientation Analysis Using Streamlines. CAIP 2007: 718-725 | |
| 49 | Matthan Caan, Koen Vermeer, Lucas J. van Vliet, Kees Grimbergen, Frans Vos: Pruning Datasets in Discriminant Analysis: A DTI Study to Schizophrenia. ISBI 2007: 1340-1344 | |
| 48 | Martijn van de Giessen, Frans Vos, Simon D. Strackee, Mario Maas, Cornelis A. Grimbergen, Lucas J. van Vliet, Geert J. Streekstra: Constrained Registration of Multiple Rigid Objects in Close Proximity: Application in the Wrist Joint. ISBI 2007: 704-707 | |
| 47 | Frans Vos, Matthan Caan, Koen Vermeer, Charles B. L. M. Majoie, G. J. den Heeten, Lucas J. van Vliet: Linear and Kernel Fisher Discriminant Analysis for Studying Diffusion Tensor Images in Schizophrenia. ISBI 2007: 764-767 | |
| 46 | Matthan Caan, Anne Willem de Vries, Ganesh Khedoe, Erik Akkerman, Lucas J. van Vliet, Kees Grimbergen, Frans Vos: Generating Fiber Crossing Phantoms Out of Experimental DWIs. MICCAI (1) 2007: 169-176 | |
| 45 | R. Joop van Heekeren, Frank G. A. Faas, Lucas J. van Vliet: Finding the Minimum-Cost Path Without Cutting Corners. SCIA 2007: 263-272 | |
| 44 | Iwo Serlie, Frans Vos, Roel Truyen, Frits H. Post, Lucas J. van Vliet: Classifying CT Image Data Into Material Fractions by a Scale and Rotation Invariant Edge Model. IEEE Transactions on Image Processing 16(12): 2891-2904 (2007) | |
| 43 | Cris L. Luengo Hendriks, Geert M. P. van Kempen, Lucas J. van Vliet: Improving the accuracy of isotropic granulometries. Pattern Recognition Letters 28(7): 865-872 (2007) | |
| 2006 | ||
| 42 | Adam W. M. van Eekeren, Klamer Schutte, Judith Dijk, Dirk-Jan J. de Lange, Lucas J. van Vliet: Super-Resolution on Moving Objects and Background. ICIP 2006: 2709-2712 | |
| 41 | Lucas J. van Vliet, Frank G. A. Faas: Multi-orientation analysis by decomposing the structure tensor and clustering. ICPR (3) 2006: 856-860 | |
| 40 | Cees van Wijk, Vincent Frans van Ravesteijn, Frans Vos, Roel Truyen, Ayso H. de Vries, Jaap Stoker, Lucas J. van Vliet: Detection of Protrusions in Curved Folded Surfaces Applied to Automated Polyp Detection in CT Colonography. MICCAI (2) 2006: 471-478 | |
| 39 | Koen Vermeer, Frans Vos, B. Lo, Qienyuan Zhou, Hans Lemij, Albert M. Vossepoel, Lucas J. van Vliet: Modeling of scanning laser polarimetry images of the human retina for progression detection of glaucoma. IEEE Trans. Med. Imaging 25(5): 517-528 (2006) | |
| 38 | Nicole J. J. P. Koenderink, Jan L. Top, Lucas J. van Vliet: Supporting knowledge-intensive inspection tasks with application ontologies. International Journal of Man-Machine Studies 64(10): 974-983 (2006) | |
| 2005 | ||
| 37 | Nicole J. J. P. Koenderink, Jan L. Top, Lucas J. van Vliet: Expert-Based Ontology Construction: A Case-Study in Horticulture. DEXA Workshops 2005: 383-387 | |
| 36 | Tuan Q. Pham, Lucas J. van Vliet: Separable bilateral filtering for fast video preprocessing. ICME 2005: 454-457 | |
| 35 | J. J. Dijkers, Cees van Wijk, Frans Vos, Jasper Florie, Y. C. Nio, Henk W. Venema, Roel Truyen, Lucas J. van Vliet: Segmentation and Size Measurement of Polyps in CT Colonography. MICCAI 2005: 712-719 | |
| 34 | Cris L. Luengo Hendriks, Lucas J. van Vliet: Using Line Segments as Structuring Elements for Sampling-Invariant Measurements. IEEE Trans. Pattern Anal. Mach. Intell. 27(11): 1826-1831 (2005) | |
| 33 | Henri Bouma, Anna Vilanova, Lucas J. van Vliet, Frans A. Gerritsen: Correction for the Dislocation of Curved Surfaces Caused by the PSF in 2D and 3D CT Images. IEEE Trans. Pattern Anal. Mach. Intell. 27(9): 1501-1507 (2005) | |
| 32 | Cris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet: The generalized Radon transform: Sampling, accuracy and memory considerations. Pattern Recognition 38(12): 2494-2505 (2005) | |
| 2004 | ||
| 31 | Lucas J. van Vliet: Robust Local Max-Min Filters by Normalized Power-Weighted Filtering. ICPR (1) 2004: 696-699 | |
| 30 | Frans Vos, Paul W. de Bruin, J. G. M. Aubel, Geert J. Streekstra, Mario Maas, Lucas J. van Vliet, Albert M. Vossepoel: A Statistical Shape Model without Using Landmarks. ICPR (3) 2004: 714-717 | |
| 29 | Lucas J. van Vliet, Piet W. Verbeek, Ian T. Young: Quantitative Imaging: How to Measure Size Features in Digitized Images. ISBI 2004: 1227-1230 | |
| 28 | Cees van Wijk, Roel Truyen, Rogier E. van Gelder, Lucas J. van Vliet, Frans Vos: On Normalized Convolution to Measure Curvature Features for Automatic Polyp Detection. MICCAI (1) 2004: 200-208 | |
| 27 | Bernd Rieger, Frederik J. Timmermans, Lucas J. van Vliet, Piet W. Verbeek: On Curvature Estimation of ISO Surfaces in 3D Gray-Value Images and the Computation of Shape Descriptors. IEEE Trans. Pattern Anal. Mach. Intell. 26(8): 1088-1094 (2004) | |
| 26 | Bernd Rieger, Lucas J. van Vliet: A systematic approach to nD orientation representation. Image Vision Comput. 22(6): 453-459 (2004) | |
| 2003 | ||
| 25 | Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek: A New Sharpness Measure Based on Gaussian Lines and Edges. CAIP 2003: 149-156 | |
| 24 | Bernd Rieger, Lucas J. van Vliet: Representing Orientation in n-Dimensional Spaces. CAIP 2003: 17-24 | |
| 23 | Cris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet: The Generalised Radon Transform: Sampling and Memory Considerations. CAIP 2003: 681-688 | |
| 22 | Cris L. Luengo Hendriks, Lucas J. van Vliet: Discrete Morphology with Line Structuring Elements. CAIP 2003: 722-729 | |
| 21 | Iwo Serlie, Roel Truyen, Jasper Florie, Frits H. Post, Lucas J. van Vliet, Frans Vos: Computed Cleansing for Virtual Colonoscopy Using a Three-Material Transition Model. MICCAI (2) 2003: 175-183 | |
| 20 | Michael van Ginkel, M. A. Kraaijveld, Lucas J. van Vliet, E. P. Reding, Piet W. Verbeek, H. J. Lammers: Robust Curve Detection Using a Radon Transform in Orientation Space. SCIA 2003: 125-132 | |
| 19 | Bernd Rieger, Lucas J. van Vliet, Piet W. Verbeek: Estimation of Curvature Based Shape Properties of Surfaces in 3D Grey-Value Images. SCIA 2003: 262-267 | |
| 18 | Frank G. A. Faas, Lucas J. van Vliet: 3D-Orientation Space; Filters and Sampling. SCIA 2003: 36-42 | |
| 17 | Tuan Q. Pham, Lucas J. van Vliet: Normalized Averaging Using Adaptive Applicability Functions with Applications in Image Reconstruction from Sparsely and Randomly Sampled Data. SCIA 2003: 485-492 | |
| 16 | Cris L. Luengo Hendriks, Lucas J. van Vliet: Basic Morphological Operations, Band-Limited Images and Sampling. Scale-Space 2003: 313-324 | |
| 2002 | ||
| 15 | Bernd Rieger, Frederik J. Timmermans, Lucas J. van Vliet, Piet W. Verbeek: Curvature Estimation of Surfaces in 3D Grey-Value Images. ICPR (1) 2002: 684-687 | |
| 14 | Bernd Rieger, Lucas J. van Vliet: Curvature of n-dimensional space curves in grey-value images. IEEE Transactions on Image Processing 11(7): 738-745 (2002) | |
| 2001 | ||
| 13 | Peter Bakker, Lucas J. van Vliet, Piet W. Verbeek: Confidence and Curvature Estimation of Curvilinear Structures in 3-D. ICCV 2001: 139-144 | |
| 12 | Cris L. Luengo Hendriks, Lucas J. van Vliet: A Rotation-Invariant Morphology for Shape Analysis of Anisotropic Objects and Structures. IWVF 2001: 378-387 | |
| 11 | Cris L. Luengo Hendriks, Lucas J. van Vliet: Segmentation-Free Estimation of Length Distributions Using Sieves and RIA Morphology. Scale-Space 2001: 398-406 | |
| 10 | Joost van de Weijer, Lucas J. van Vliet, Piet W. Verbeek, Michael van Ginkel: Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields. IEEE Trans. Pattern Anal. Mach. Intell. 23(9): 1035-1042 (2001) | |
| 2000 | ||
| 9 | L. R. Van den Doel, Lucas J. van Vliet, K. T. Hjelt, M. J. Vellekoop, Ian T. Young, F. Gromball, Jan G. Korvink: Nanometer-Scale Height Measurements in Micromachined Picoliter Vials Based on Interference Fringe Analysis. ICPR 2000: 3057-3062 | |
| 8 | Ian T. Young, Lucas J. van Vliet, Michael van Ginkel: Recursive Gabor Filtering. ICPR 2000: 3342-3345 | |
| 1999 | ||
| 7 | Peter Bakker, Lucas J. van Vliet, Piet W. Verbeek: Edge Preserving Orientation Adaptive Filtering. CVPR 1999: 1535-1540 | |
| 1998 | ||
| 6 | Dick de Ridder, Robert P. W. Duin, Piet W. Verbeek, Lucas J. van Vliet: On the Application of Neural Networks to Non-Linear Image Processing Tasks. ICONIP 1998: 161-165 | |
| 5 | Frank de Jong, Lucas J. van Vliet, Pieter P. Jonker: Gradient Estimation in Uncertain Data. MVA 1998: 144-147 | |
| 1994 | ||
| 4 | Piet W. Verbeek, Lucas J. van Vliet: On the Location Error of Curved Edges in Low-Pass Filtered 2-D and 3-D Images. IEEE Trans. Pattern Anal. Mach. Intell. 16(7): 726-733 (1994) | |
| 3 | Lucas J. van Vliet, Piet W. Verbeek: Edge localization by MoG filters: Multiple-of-Gaussians. Pattern Recognition Letters 15(5): 485-496 (1994) | |
| 1993 | ||
| 2 | Ben J. H. Verwer, Lucas J. van Vliet, Piet W. Verbeek: Binary and Grey-Value Skeletons: Metrics and Algorithms. IJPRAI 7(5): 1287-1308 (1993) | |
| 1989 | ||
| 1 | Lucas J. van Vliet, Ian T. Young, Guus L. Beckers: A nonlinear laplace operator as edge detector in noisy images. Computer Vision, Graphics, and Image Processing 45(2): 167-195 (1989) | |