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DBLP keys2007
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHao San, Yoshitaka Jingu, Hiroki Wada, Hiroyuki Hagiwara, Akira Hayakawa, Haruo Kobayashi, Masao Hotta: A 2.8-V Multibit Complex Bandpass Delta-Sigma-AD Modulator in 0.18µm CMOS. ASP-DAC 2007: 96-97
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHao San, Yoshitaka Jingu, Hiroki Wada, Hiroyuki Hagiwara, Akira Hayakawa, Haruo Kobayashi, Tatsuji Matsuura, Kouichi Yahagi, Junya Kudoh, Hideo Nakane, Masao Hotta, Toshiro Tsukada, Koichiro Mashiko, Atsushi Wada: A Second-Order Multibit Complex Bandpass DeltaSigmaAD Modulator with I, Q Dynamic Matching and DWA Algorithm. IEICE Transactions 90-C(6): 1181-1188 (2007)
2006
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHao San, Akira Hayakawa, Yoshitaka Jingu, Hiroki Wada, Hiroyuki Hagiwara, Kazuyuki Kobayashi, Haruo Kobayashi, Tatsuji Matsuura, Kouichi Yahagi, Junya Kudoh, Hideo Nakane, Masao Hotta, Toshiro Tsukada, Koichiro Mashiko, Atsushi Wada: Complex Bandpass DeltaSigmaAD Modulator Architecture without I, Q-Path Crossing Layout. IEICE Transactions 89-A(4): 908-915 (2006)
2001
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSatoshi Ohtake, Shintaro Nagai, Hiroki Wada, Hideo Fujiwara: A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability. ASP-DAC 2001: 331-334
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKen-ichi Yamaguchi, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara: BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths. Asian Test Symposium 2001: 313-318
2000
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSatoshi Ohtake, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara: A non-scan DFT method at register-transfer level to achieve complete fault efficiency. ASP-DAC 2000: 599-604
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLToshimitsu Masuzawa, Minoru Izutsu, Hiroki Wada, Hideo Fujiwara: Single-control testability of RTL data paths for BIST. Asian Test Symposium 2000: 210-215
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroki Wada, Toshimitsu Masuzawa, Kewal K. Saluja, Hideo Fujiwara: Design for Strong Testability of RTL Data Paths to Provide Complete Fault Efficiency. VLSI Design 2000: 300-305

Coauthor Index

1Hideo Fujiwara [1] [2] [3] [4] [5]
2Hiroyuki Hagiwara [6] [7] [8]
3Akira Hayakawa [6] [7] [8]
4Masao Hotta [6] [7] [8]
5Minoru Izutsu [2]
6Yoshitaka Jingu [6] [7] [8]
7Haruo Kobayashi [6] [7] [8]
8Kazuyuki Kobayashi [6]
9Junya Kudoh [6] [7]
10Koichiro Mashiko [6] [7]
11Toshimitsu Masuzawa [1] [2] [3] [4]
12Tatsuji Matsuura [6] [7]
13Shintaro Nagai [5]
14Hideo Nakane [6] [7]
15Satoshi Ohtake [3] [5]
16Kewal K. Saluja [1]
17Hao San [6] [7] [8]
18Toshiro Tsukada [6] [7]
19Atsushi Wada [6] [7]
20Kouichi Yahagi [6] [7]
21Ken-ichi Yamaguchi [4]

Colors in the list of coauthors

Copyright © Wed Dec 23 18:45:02 2009 by Michael Ley (ley@uni-trier.de)