John A. Waicukauski Coauthor index DBLP Vis pubzone.org

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27Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski, Sanjay Patel: Automated Design and Insertion of Optimal One-Hot Bus Encoders. VTS 2007: 409-415
26Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski, Rohit Kapur, S. Ramnath, Emil Gizdarski, Thomas W. Williams, P. Jaini: Minimizing the Impact of Scan Compression. VTS 2007: 67-74
2005
25Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski, Sanjay Patel, Cy Hay, Emil Gizdarski, Ben Mathew: Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST. VTS 2005: 359-365
2004
24Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski, Sanjay Patel: Scalable selector architecture for x-tolerant deterministic BIST. DAC 2004: 934-939
2003
23Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin: Efficient compression and application of deterministic patterns in a logic BIST architecture. DAC 2003: 566-569
22Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin: X-Tolerant Compression And Application of Scan-ATPG Patterns In A BIST Architecture. ITC 2003: 727-736
2002
21Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski, Sanjay Patel, Gregory A. Maston: Effective diagnostics through interval unloads in a BIST environment. DAC 2002: 249-254
20Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVishal Jain, John A. Waicukauski: Scan Test Data Volume Reduction in Multi-Clocked Designs with Safe Capture Technique. ITC 2002: 148-153
2001
19no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski, Thomas W. Williams: Design of compactors for signature-analyzers in built-in self-test. ITC 2001: 54-63
2000
18no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski: Optimizing the flattened test-generation model for very large designs. ITC 2000: 681-690
1999
17no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski: Using Verilog simulation libraries for ATPG. ITC 1999: 1011-1020
1998
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski: Extracting gate-level networks from simulation tables. ITC 1998: 622-631
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski: Defining ATPG rules checking in STIL. ITC 1998: 971-979
1997
14no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski: A Unified Interface for Scan Test Generation Based on STIL. ITC 1997: 1011-1019
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski: Using ATPG for clock rules checking in complex scan design. VTS 1997: 130-136
1996
12no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski: Test Generation for Ultra-Large Circuits Using ATPG Constraints and Test-Pattern Templates. ITC 1996: 13-20
11no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBejoy G. Oomman, Wu-Tung Cheng, John A. Waicukauski: A Universal Technique for Accelerating Simulation of Scan Test Patterns. ITC 1996: 135-141
10no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNadime Zacharia, Janusz Rajski, Jerzy Tyszer, John A. Waicukauski: Two-Dimensional Test Data Decompressor for Multiple Scan Designs. ITC 1996: 186-194
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Wohl, John A. Waicukauski, Matthew Graf: Testing "untestable" faults in three-state circuits. VTS 1996: 324-331
1990
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVijay S. Iyengar, Barry K. Rosen, John A. Waicukauski: On computing the sizes of detected delay faults. IEEE Trans. on CAD of Integrated Circuits and Systems 9(3): 299-312 (1990)
1989
7no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJohn A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Orazio P. Forlenza: A Method for Generating Weighted Random Test Patterns. IBM Journal of Research and Development 33(2): 149-161 (1989)
1988
6no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMiron Abramovici, B. Krishnamurthy, A. Mathews, B. Rogers, M. Schulz, S. Seth, John A. Waicukauski: What is the Path to Fast Fault Simulation? ITC 1988: 183-192
5no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJohn A. Waicukauski, Eric Lindbloom: Fault Detection Effectiveness of Weighted Random Patterns. ITC 1988: 245-255
1986
4no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJohn A. Waicukauski, Eric Lindbloom, Vijay S. Iyengar, Barry K. Rosen: Transition Fault Simulation by Parallel Pattern Single Fault Propagation. ITC 1986: 542-551
1985
3no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJohn A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Donato O. Forlenza, Tim McCarthy: A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation. ITC 1985: 779-784
1983
2no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFranco Motika, John A. Waicukauski, Edward B. Eichelberger, Eric Lindbloom: An LSSD Pseudo Random Pattern Test System. ITC 1983: 283-288
1981
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLY. Arzoumanian, John A. Waicukauski: Fault Diagnosis in an LSSD Environment. ITC 1981: 86-88

Coauthor Index

1Miron Abramovici [6]
2Minesh B. Amin [22] [23]
3Y. Arzoumanian [1]
4Wu-Tung Cheng [11]
5Edward B. Eichelberger [2] [3] [7]
6Donato O. Forlenza [3]
7Orazio P. Forlenza [7]
8Emil Gizdarski [25] [26]
9Matthew Graf [9]
10Cy Hay [25]
11Vijay S. Iyengar [4] [8]
12Vishal Jain [20]
13P. Jaini [26]
14Rohit Kapur [26]
15B. Krishnamurthy [6]
16Eric Lindbloom [2] [3] [4] [5] [7]
17Gregory A. Maston [21]
18Ben Mathew [25]
19A. Mathews [6]
20Tim McCarthy [3]
21Franco Motika [2]
22Bejoy G. Oomman [11]
23Sanjay Patel [21] [22] [23] [24] [25] [27]
24Janusz Rajski [10]
25S. Ramnath [26]
26B. Rogers [6]
27Barry K. Rosen [4] [8]
28M. Schulz [6]
29S. Seth [6]
30Jerzy Tyszer [10]
31Thomas W. Williams [19] [26]
32Peter Wohl [9] [12] [13] [14] [15] [16] [17] [18] [19] [21] [22] [23] [24] [25] [26] [27]
33Nadime Zacharia [10]

Colors in the list of coauthors

Copyright © Mon Nov 30 15:58:31 2009 by Michael Ley (ley@uni-trier.de)