Ken Walker

	2001
1		John T. Chen, Jitendra Khare, Ken Walker, Saghir A. Shaikh, Janusz Rajski, Wojciech Maly: Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring. ITC 2001: 258-267

Coauthor Index

1	John T. Chen	[1]
2	Jitendra Khare	[1]
3	Wojciech Maly	[1]
4	Janusz Rajski	[1]
5	Saghir A. Shaikh	[1]