Anthony J. Walton

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1999

4 Gerard A. Allan, Anthony J. Walton: Efficient extra material critical area algorithms. IEEE Trans. on CAD of Integrated Circuits and Systems 18(10): 1480-1486 (1999)

1997

3 Gerard A. Allan, Anthony J. Walton: Efficient critical area estimation for arbitrary defect shapes. DFT 1997: 20-28

1994

2 Gerard A. Allan, Anthony J. Walton: Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. DFT 1994: 88-96

1992

1 Gerard A. Allan, Anthony J. Walton, Robert J. Holwill: A yield improvement technique for IC layout using local design rules. IEEE Trans. on CAD of Integrated Circuits and Systems 11(11): 1355-1362 (1992)

	1999
4		Gerard A. Allan, Anthony J. Walton: Efficient extra material critical area algorithms. IEEE Trans. on CAD of Integrated Circuits and Systems 18(10): 1480-1486 (1999)
	1997
3		Gerard A. Allan, Anthony J. Walton: Efficient critical area estimation for arbitrary defect shapes. DFT 1997: 20-28
	1994
2		Gerard A. Allan, Anthony J. Walton: Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. DFT 1994: 88-96
	1992
1		Gerard A. Allan, Anthony J. Walton, Robert J. Holwill: A yield improvement technique for IC layout using local design rules. IEEE Trans. on CAD of Integrated Circuits and Systems 11(11): 1355-1362 (1992)

Coauthor Index