Chih-Hsiung Wang Coauthor index DBLP Vis pubzone.org

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DBLP keys2009
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Hsiung Wang: Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing. European Journal of Operational Research 197(1): 126-133 (2009)
2007
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Hsiung Wang: Economic off-line quality control strategy with two types of inspection errors. European Journal of Operational Research 179(1): 132-147 (2007)
2004
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Hsiung Wang: The impact of a free-repair warranty policy on EMQ model for imperfect production systems. Computers & OR 31(12): 2021-2035 (2004)
2003
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Hsiung Wang, Shey-Huei Sheu: Determining the optimal production-maintenance policy with inspection errors: using a Markov chain. Computers & OR 30(1): 1-17 (2003)
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Hsiung Wang, Shey-Huei Sheu: Optimal lot sizing for products sold under free-repair warranty. European Journal of Operational Research 149(1): 131-141 (2003)
2001
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChih-Hsiung Wang, Shey-Huei Sheu: Simultaneous determination of the optimal production-inventory and product inspection policies for a deteriorating production system. Computers & OR 28(11): 1093-1110 (2001)

Coauthor Index

1Shey-Huei Sheu [1] [2] [3]

Copyright © Thu Dec 10 16:00:26 2009 by Michael Ley (ley@uni-trier.de)