Laung-Terng Wang

	2009
24		Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Wen-Ben Jone, Jianghao Guo, Kuen-Jong Lee, Wei-Shin Wang, Xiaoqing Wen, Hao-Jan Chao, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li: Turbo1500: Core-Based Design for Test and Diagnosis. IEEE Design & Test of Computers 26(1): 26-35 (2009)
	2008
23		Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael Hsiao, James Chien-Mo Li, Jiun Lang Huang, Ravi Apte: On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. DFT 2008: 143-151
22		Laung-Terng Wang, Charles E. Stroud, Kwang-Ting (Tim) Cheng: Logic Testing. Wiley Encyclopedia of Computer Science and Engineering 2008
21		Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu: VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. IEEE Design & Test of Computers 25(2): 122-130 (2008)
20		Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. J. Electronic Testing 24(4): 379-391 (2008)
	2007
19		B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, P. Hsu, J. Cho, J. Park, H. Chao, Shianling Wu: At-Speed Logic BIST for IP Cores CoRR abs/0710.4645: (2007)
18		Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Novel ATPG Method for Capture Power Reduction during Scan Testing. IEICE Transactions 90-D(9): 1398-1405 (2007)
	2006
17		Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja: Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. ICCD 2006
16		Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita: A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. VTS 2006: 58-65
15		Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Per-Test Fault Diagnosis Method Based on the X-Fault Model. IEICE Transactions 89-D(11): 2756-2765 (2006)
14		Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: A New Method for Low-Capture-Power Test Generation for Scan Testing. IEICE Transactions 89-D(5): 1679-1686 (2006)
	2005
13		B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, P. Hsu, J. Cho, J. Park, H. Chao, Shianling Wu: At-Speed Logic BIST for IP Cores. DATE 2005: 860-861
12		Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Shianling Wu, Jonhson Guo: At-Speed Logic BIST Architecture for Multi-Clock Designs. ICCD 2005: 475-478
11		Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: On Low-Capture-Power Test Generation for Scan Testing. VTS 2005: 265-270
10		Xiaoqing Wen, Tatsuya Suzuki, Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Laung-Terng Wang, Kewal K. Saluja: Efficient Test Set Modification for Capture Power Reduction. J. Low Power Electronics 1(3): 319-330 (2005)
	2004
9		Xiaoqing Wen, Tokiharu Miyoshi, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: On per-test fault diagnosis using the X-fault model. ICCAD 2004: 633-640
8		Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai: VirtualScan: A New Compressed Scan Technology for Test Cost Reduction. ITC 2004: 916-925
	1988
7		Laung-Terng Wang, Edward J. McCluskey: Linear Feedback Shift Register Design Using Cyclic Codes. IEEE Trans. Computers 37(10): 1302-1306 (1988)
6		Laung-Terng Wang, Edward J. McCluskey: Hybrid designs generating maximum-length sequences. IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 91-99 (1988)
5		Laung-Terng Wang, Edward J. McCluskey: Circuits for pseudoexhaustive test pattern generation. IEEE Trans. on CAD of Integrated Circuits and Systems 7(10): 1068-1080 (1988)
	1986
4		Laung-Terng Wang, Edward J. McCluskey: Circuits for Pseudo-Exhaustive Test Pattern Generation. ITC 1986: 25-37
3		Laung-Terng Wang, Edward J. McCluskey: A Hybrid Design of Maximum-Length Sequence Generators. ITC 1986: 38-47
2		Laung-Terng Wang, Edward J. McCluskey: Condensed Linear Feedback Shift Register (LFSR) Testing - A Pseudoexhaustive Test Technique. IEEE Trans. Computers 35(4): 367-370 (1986)
	1984
1		Zuhi Sun, Laung-Terng Wang: Self-Testing of Embedded RAMs. ITC 1984: 148-156

Coauthor Index

1	Khader S. Abdel-Hafez	[8] [16]
2	Ravi Apte	[23] [24]
3	H. Chao	[13] [19]
4	Hao-Jan Chao	[24]
5	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[22]
6	B. Cheon	[13] [19]
7	J. Cho	[13] [19]
8	Hiroshi Furukawa	[8]
9	Xinli Gu	[21]
10	Jianghao Guo	[24]
11	Jonhson Guo	[12]
12	Michael Hsiao	[23]
13	Fei-Sheng Hsu	[8]
14	P. Hsu	[13] [19]
15	Po-Ching Hsu	[12]
16	Jiun Lang Huang	[23]
17	Zhigang Jiang	[21] [23]
18	Wen-Ben Jone	[24]
19	Seiji Kajihara	[9] [10] [11] [14] [15] [16] [17] [18] [20]
20	Kozo Kinoshita	[9] [11] [14] [15] [16] [18] [20]
21	E. Lee	[13] [19]
22	Kuen-Jong Lee	[24]
23	Chien-Mo James Li (James Chien-Mo Li)	[23]
24	Fangfang Li	[24]
25	Shyh-Horng Lin	[8]
26	Jinsong Liu	[24]
27	Edward J. McCluskey	[2] [3] [4] [5] [6] [7]
28	Yoshihiro Minamoto	[10]
29	Kohei Miyase	[10] [15] [16] [17] [18] [20]
30	Tokiharu Miyoshi	[9]
31	Yanlong Niu	[24]
32	J. Park	[13] [19]
33	Kewal K. Saluja	[9] [10] [11] [14] [15] [16] [17] [18] [20]
34	Boryau Sheu	[21] [23] [24]
35	Jiayong Song	[23]
36	Charles E. Stroud	[22]
37	Zuhi Sun	[1]
38	Yi-Chih Sung	[24]
39	Tatsuya Suzuki	[10] [16] [17] [18] [20]
40	Sen-Wei Tsai	[8]
41	Chi-Chun Wang	[24]
42	Wei-Shin Wang	[24]
43	Zhigang Wang	[21]
44	Xiaoqing Wen	[8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [23] [24]
45	Shianling Wu	[8] [12] [13] [19] [21] [23] [24]
46	Yoshiyuki Yamashita	[11] [14]
47	Yuta Yamato	[15] [17]

Colors in the list of coauthors