Kazufumi Watanabe

	2007
2		Kazufumi Watanabe, Akinobu Teramoto, Rihito Kuroda, Shigetoshi Sugawa, Tadahiro Ohmi: Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction. Microelectronics Reliability 47(2-3): 409-418 (2007)
	1984
1		Hiroshi G. Okuno, Ikuo Takeuchi, Nobuyasu Ohsato, Yasushi Hibino, Kazufumi Watanabe: TAO: Afst Interpreter-Centered Lisp System on Lisp Machine ELIS. LISP and Functional Programming 1984: 140-149

Coauthor Index

1	Yasushi Hibino	[1]
2	Rihito Kuroda	[2]
3	Tadahiro Ohmi	[2]
4	Nobuyasu Ohsato	[1]
5	Hiroshi G. Okuno	[1]
6	Shigetoshi Sugawa	[2]
7	Ikuo Takeuchi	[1]
8	Akinobu Teramoto	[2]

Colors in the list of coauthors