J. R. Watling

	2004
1		L. Yang, Asen Asenov, J. R. Watling, M. Boriçi, J. R. Barker, Scott Roy, K. Elgaid, I. Thayne, T. Hackbarth: Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs. Microelectronics Reliability 44(7): 1101-1107 (2004)

Coauthor Index

1	Asen Asenov	[1]
2	J. R. Barker	[1]
3	M. Boriçi	[1]
4	K. Elgaid	[1]
5	T. Hackbarth	[1]
6	Scott Roy	[1]
7	I. Thayne	[1]
8	L. Yang	[1]