Xiaoqing Wen

	2009
46		K. Enokimoto, Xiaoqing Wen, Yuta Yamato, Kohei Miyase, H. Sone, Seiji Kajihara, M. Aso, Hiroshi Furukawa: CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing. Asian Test Symposium 2009: 99-104
45		Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara: A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. PRDC 2009: 81-86
44		Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Wen-Ben Jone, Jianghao Guo, Kuen-Jong Lee, Wei-Shin Wang, Xiaoqing Wen, Hao-Jan Chao, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li: Turbo1500: Core-Based Design for Test and Diagnosis. IEEE Design & Test of Computers 26(1): 26-35 (2009)
	2008
43		Dimitris Gizopoulos, Kaushik Roy, Patrick Girard, Nicola Nicolici, Xiaoqing Wen: Power-Aware Testing and Test Strategies for Low Power Devices. DATE 2008
42		Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen: Diagnosis of Realistic Defects Based on the X-Fault Model. DDECS 2008: 263-266
41		Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael Hsiao, James Chien-Mo Li, Jiun Lang Huang, Ravi Apte: On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. DFT 2008: 143-151
40		Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara: Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. ICCAD 2008: 52-58
39		Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu: VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. IEEE Design & Test of Computers 25(2): 122-130 (2008)
38		Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara: A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits. IEICE Transactions 91-D(3): 667-674 (2008)
37		Kohei Miyase, Kenta Terashima, Xiaoqing Wen, Seiji Kajihara, Sudhakar M. Reddy: On Detection of Bridge Defects with Stuck-at Tests. IEICE Transactions 91-D(3): 683-689 (2008)
36		Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. J. Electronic Testing 24(4): 379-391 (2008)
	2007
35		Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja: Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. DAC 2007: 527-532
34		Nicola Nicolici, Xiaoqing Wen: Embedded Tutorial on Low Power Test. European Test Symposium 2007: 202-210
33		Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo: Estimation of delay test quality and its application to test generation. ICCAD 2007: 413-417
32		B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, P. Hsu, J. Cho, J. Park, H. Chao, Shianling Wu: At-Speed Logic BIST for IP Cores CoRR abs/0710.4645: (2007)
31		Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Novel ATPG Method for Capture Power Reduction during Scan Testing. IEICE Transactions 90-D(9): 1398-1405 (2007)
	2006
30		Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato: A dynamic test compaction procedure for high-quality path delay testing. ASP-DAC 2006: 348-353
29		Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja: Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. ICCD 2006
28		Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita: A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. VTS 2006: 58-65
27		Yu Hu, Yinhe Han, Xiaowei Li, Huawei Li, Xiaoqing Wen: Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time. IEICE Transactions 89-D(10): 2616-2625 (2006)
26		Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Per-Test Fault Diagnosis Method Based on the X-Fault Model. IEICE Transactions 89-D(11): 2756-2765 (2006)
25		Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: A New Method for Low-Capture-Power Test Generation for Scan Testing. IEICE Transactions 89-D(5): 1679-1686 (2006)
	2005
24		Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty: Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. ASP-DAC 2005: 59-64
23		Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy: On Improving Defect Coverage of Stuck-at Fault Tests. Asian Test Symposium 2005: 216-223
22		Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato: Path delay test compaction with process variation tolerance. DAC 2005: 845-850
21		B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, P. Hsu, J. Cho, J. Park, H. Chao, Shianling Wu: At-Speed Logic BIST for IP Cores. DATE 2005: 860-861
20		Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Shianling Wu, Jonhson Guo: At-Speed Logic BIST Architecture for Multi-Clock Designs. ICCD 2005: 475-478
19		Yu Hu, Xiaowei Li, Huawei Li, Xiaoqing Wen: Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation and Test Application Time. PRDC 2005: 175-182
18		Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: On Low-Capture-Power Test Generation for Scan Testing. VTS 2005: 265-270
17		Xiaoqing Wen, Seiji Kajihara, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita: On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies. IEICE Transactions 88-D(4): 703-710 (2005)
16		Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra, Xiaoqing Wen: Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores. IEICE Transactions 88-D(9): 2126-2134 (2005)
15		Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita: Fault Diagnosis of Physical Defects Using Unknown Behavior Model. J. Comput. Sci. Technol. 20(2): 187-194 (2005)
14		Xiaoqing Wen, Tatsuya Suzuki, Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Laung-Terng Wang, Kewal K. Saluja: Efficient Test Set Modification for Capture Power Reduction. J. Low Power Electronics 1(3): 319-330 (2005)
	2004
13		Xiaoqing Wen, Tokiharu Miyoshi, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: On per-test fault diagnosis using the X-fault model. ICCAD 2004: 633-640
12		Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai: VirtualScan: A New Compressed Scan Technology for Test Cost Reduction. ITC 2004: 916-925
	2003
11		Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita: Fault Diagnosis for Physical Defects of Unknown Behaviors. Asian Test Symposium 2003: 236-241
	2001
10		Xiaoqing Wen, Hsin-Po Wang: A Flexible Logic BIST Scheme and Its Application to SoC Designs. Asian Test Symposium 2001: 463
	1999
9		Hiroshi Yokoyama, Xiaoqing Wen, Hideo Tamamoto: Random pattern testable design with partial circuit duplication and IDDQ testing. Systems and Computers in Japan 30(5): 18-27 (1999)
	1998
8		Xiaoqing Wen, Tooru Honzawa, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita: Design for Diagnosability of CMOS Circuits. Asian Test Symposium 1998: 144-149
	1997
7		Xiaoqing Wen: Fault Diagnosis for Static CMOS Circuits. Asian Test Symposium 1997: 282-287
6		Hiroshi Yokoyama, Xiaoqing Wen, Hideo Tamamoto: Random Pattern Testable Design with Partial Circuit Duplication. Asian Test Symposium 1997: 353-358
5		Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita: IDDQ test vector selection for transistor short fault testing. Systems and Computers in Japan 28(5): 11-21 (1997)
	1996
4		Xiaoqing Wen, Kewal K. Saluja: A new method towards achieving global optimality in technology mapping. ICCAD 1996: 9-12
	1995
3		Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita: Transistor leakage fault location with ZDDQ measurement. Asian Test Symposium 1995: 51-57
	1992
2		Xiaoqing Wen, Kozo Kinoshita: Testable Designs of Sequential Circuits Under Highly Observable Condition. ITC 1992: 632-641
1		Xiaoqing Wen, Kozo Kinoshita: A Testable Design of Logic Circuits under Highly Observable Condition. IEEE Trans. Computers 41(5): 654-659 (1992)

Coauthor Index

1	Khader S. Abdel-Hafez	[12] [28]
2	Takashi Aikyo	[33] [40]
3	Ravi Apte	[41] [44]
4	M. Aso	[46]
5	Bernd Becker	[42]
6	Krishnendu Chakrabarty	[24]
7	Anshuman Chandra	[16]
8	H. Chao	[21] [32]
9	Hao-Jan Chao	[44]
10	B. Cheon	[21] [32]
11	J. Cho	[21] [32]
12	Yasumi Doi	[24]
13	Piet Engelke	[42]
14	K. Enokimoto	[46]
15	Masayasu Fukunaga	[22] [30] [33]
16	Hiroshi Furukawa	[12] [40] [45] [46]
17	Patrick Girard	[43]
18	Dimitris Gizopoulos	[43]
19	Xinli Gu	[39]
20	Jianghao Guo	[44]
21	Jonhson Guo	[20]
22	Shuji Hamada	[22] [30]
23	Yinhe Han	[16] [27]
24	Kazumi Hatayama	[33] [40]
25	Tooru Honzawa	[8]
26	Michael Hsiao	[41]
27	Fei-Sheng Hsu	[12]
28	P. Hsu	[21] [32]
29	Po-Ching Hsu	[20]
30	Yu Hu	[16] [19] [27]
31	Jiun Lang Huang	[41]
32	Hideaki Ito	[40]
33	Zhigang Jiang	[39] [41]
34	Wen-Ben Jone	[44]
35	Seiji Kajihara	[13] [14] [17] [18] [22] [23] [24] [25] [26] [28] [29] [30] [31] [33] [35] [36] [37] [38] [40] [42] [45] [46]
36	Kozo Kinoshita	[1] [2] [3] [5] [8] [11] [13] [15] [17] [18] [25] [26] [28] [31] [36]
37	E. Lee	[21] [32]
38	Kuen-Jong Lee	[44]
39	Chien-Mo James Li (James Chien-Mo Li)	[41]
40	Fangfang Li	[44]
41	Huawei Li	[16] [19] [27]
42	Lei Li	[24]
43	Xiaowei Li	[16] [19] [27]
44	Shyh-Horng Lin	[12]
45	Jinsong Liu	[44]
46	Toshiyuki Maeda	[22] [30]
47	Yoshihiro Minamoto	[14]
48	Kohei Miyase	[14] [23] [26] [28] [29] [31] [35] [36] [37] [38] [40] [42] [45] [46]
49	Tokiharu Miyoshi	[13]
50	Shohei Morishima	[33]
51	Yusuke Nakamura	[38] [42]
52	Nicola Nicolici	[34] [43]
53	Yanlong Niu	[44]
54	Kenji Noda	[40]
55	Yuji Ohsumi	[35]
56	J. Park	[21] [32]
57	Ilia Polian	[42]
58	Sudhakar M. Reddy	[23] [37]
59	Kaushik Roy	[43]
60	Kewal K. Saluja	[4] [8] [11] [13] [14] [15] [17] [18] [25] [26] [28] [29] [31] [35] [36]
61	Yasuo Sato	[22] [30]
62	Boryau Sheu	[39] [41] [44]
63	H. Sone	[46]
64	Jiayong Song	[41]
65	Stefan Spinner	[42]
66	Yi-Chih Sung	[44]
67	Tatsuya Suzuki	[14] [28] [29] [31] [35] [36]
68	Hideo Tamamoto	[3] [5] [6] [8] [9] [11] [15] [17]
69	Kenta Terashima	[23] [37]
70	Sen-Wei Tsai	[12]
71	Chi-Chun Wang	[44]
72	Hsin-Po Wang	[10]
73	Laung-Terng Wang	[12] [13] [14] [18] [20] [21] [25] [26] [28] [29] [31] [32] [36] [39] [41] [44]
74	Wei-Shin Wang	[44]
75	Zhigang Wang	[39]
76	Shianling Wu	[12] [20] [21] [32] [39] [41] [44]
77	Masahiro Yamamoto	[33]
78	Yoshiyuki Yamashita	[18] [25]
79	Yuta Yamato	[26] [29] [38] [40] [45] [46]
80	Hiroshi Yokoyama	[6] [9]