Xiaoqing Wen

2008
40	EE	Dimitris Gizopoulos, Kaushik Roy, Patrick Girard, Nicola Nicolici, Xiaoqing Wen: Power-Aware Testing and Test Strategies for Low Power Devices. DATE 2008
39	EE	Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen: Diagnosis of Realistic Defects Based on the X-Fault Model. DDECS 2008: 263-266
38	EE	Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu: VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. IEEE Design & Test of Computers 25(2): 122-130 (2008)
37	EE	Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara: A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits. IEICE Transactions 91-D(3): 667-674 (2008)
36	EE	Kohei Miyase, Kenta Terashima, Xiaoqing Wen, Seiji Kajihara, Sudhakar M. Reddy: On Detection of Bridge Defects with Stuck-at Tests. IEICE Transactions 91-D(3): 683-689 (2008)
2007
35	EE	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja: Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. DAC 2007: 527-532
34	EE	Nicola Nicolici, Xiaoqing Wen: Embedded Tutorial on Low Power Test. European Test Symposium 2007: 202-210
33	EE	Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo: Estimation of delay test quality and its application to test generation. ICCAD 2007: 413-417
32	EE	B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, P. Hsu, J. Cho, J. Park, H. Chao, Shianling Wu: At-Speed Logic BIST for IP Cores CoRR abs/0710.4645: (2007)
31	EE	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Novel ATPG Method for Capture Power Reduction during Scan Testing. IEICE Transactions 90-D(9): 1398-1405 (2007)
2006
30	EE	Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato: A dynamic test compaction procedure for high-quality path delay testing. ASP-DAC 2006: 348-353
29	EE	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja: Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. ICCD 2006
28	EE	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita: A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. VTS 2006: 58-65
27	EE	Yu Hu, Yinhe Han, Xiaowei Li, Huawei Li, Xiaoqing Wen: Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time. IEICE Transactions 89-D(10): 2616-2625 (2006)
26	EE	Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Per-Test Fault Diagnosis Method Based on the X-Fault Model. IEICE Transactions 89-D(11): 2756-2765 (2006)
25	EE	Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: A New Method for Low-Capture-Power Test Generation for Scan Testing. IEICE Transactions 89-D(5): 1679-1686 (2006)
2005
24	EE	Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty: Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. ASP-DAC 2005: 59-64
23	EE	Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy: On Improving Defect Coverage of Stuck-at Fault Tests. Asian Test Symposium 2005: 216-223
22	EE	Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato: Path delay test compaction with process variation tolerance. DAC 2005: 845-850
21	EE	B. Cheon, E. Lee, Laung-Terng Wang, Xiaoqing Wen, P. Hsu, J. Cho, J. Park, H. Chao, Shianling Wu: At-Speed Logic BIST for IP Cores. DATE 2005: 860-861
20	EE	Laung-Terng Wang, Xiaoqing Wen, Po-Ching Hsu, Shianling Wu, Jonhson Guo: At-Speed Logic BIST Architecture for Multi-Clock Designs. ICCD 2005: 475-478
19	EE	Yu Hu, Xiaowei Li, Huawei Li, Xiaoqing Wen: Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation and Test Application Time. PRDC 2005: 175-182
18	EE	Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: On Low-Capture-Power Test Generation for Scan Testing. VTS 2005: 265-270
17	EE	Xiaoqing Wen, Seiji Kajihara, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita: On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies. IEICE Transactions 88-D(4): 703-710 (2005)
16	EE	Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra, Xiaoqing Wen: Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores. IEICE Transactions 88-D(9): 2126-2134 (2005)
15	EE	Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita: Fault Diagnosis of Physical Defects Using Unknown Behavior Model. J. Comput. Sci. Technol. 20(2): 187-194 (2005)
14	EE	Xiaoqing Wen, Tatsuya Suzuki, Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Laung-Terng Wang, Kewal K. Saluja: Efficient Test Set Modification for Capture Power Reduction. J. Low Power Electronics 1(3): 319-330 (2005)
2004
13	EE	Xiaoqing Wen, Tokiharu Miyoshi, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: On per-test fault diagnosis using the X-fault model. ICCAD 2004: 633-640
12	EE	Laung-Terng Wang, Khader S. Abdel-Hafez, Shianling Wu, Xiaoqing Wen, Hiroshi Furukawa, Fei-Sheng Hsu, Shyh-Horng Lin, Sen-Wei Tsai: VirtualScan: A New Compressed Scan Technology for Test Cost Reduction. ITC 2004: 916-925
2003
11	EE	Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita: Fault Diagnosis for Physical Defects of Unknown Behaviors. Asian Test Symposium 2003: 236-241
2001
10	EE	Xiaoqing Wen, Hsin-Po Wang: A Flexible Logic BIST Scheme and Its Application to SoC Designs. Asian Test Symposium 2001: 463
1999
9	EE	Hiroshi Yokoyama, Xiaoqing Wen, Hideo Tamamoto: Random pattern testable design with partial circuit duplication and IDDQ testing. Systems and Computers in Japan 30(5): 18-27 (1999)
1998
8	EE	Xiaoqing Wen, Tooru Honzawa, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita: Design for Diagnosability of CMOS Circuits. Asian Test Symposium 1998: 144-149
1997
7	EE	Xiaoqing Wen: Fault Diagnosis for Static CMOS Circuits. Asian Test Symposium 1997: 282-287
6	EE	Hiroshi Yokoyama, Xiaoqing Wen, Hideo Tamamoto: Random Pattern Testable Design with Partial Circuit Duplication. Asian Test Symposium 1997: 353-358
5	EE	Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita: IDDQ test vector selection for transistor short fault testing. Systems and Computers in Japan 28(5): 11-21 (1997)
1996
4	EE	Xiaoqing Wen, Kewal K. Saluja: A new method towards achieving global optimality in technology mapping. ICCAD 1996: 9-12
1995
3	EE	Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita: Transistor leakage fault location with ZDDQ measurement. Asian Test Symposium 1995: 51-57
1992
2		Xiaoqing Wen, Kozo Kinoshita: Testable Designs of Sequential Circuits Under Highly Observable Condition. ITC 1992: 632-641
1		Xiaoqing Wen, Kozo Kinoshita: A Testable Design of Logic Circuits under Highly Observable Condition. IEEE Trans. Computers 41(5): 654-659 (1992)

Coauthor Index

1	Khader S. Abdel-Hafez	[12] [28]
2	Takashi Aikyo	[33]
3	Bernd Becker	[39]
4	Krishnendu Chakrabarty	[24]
5	Anshuman Chandra	[16]
6	H. Chao	[21] [32]
7	B. Cheon	[21] [32]
8	J. Cho	[21] [32]
9	Yasumi Doi	[24]
10	Piet Engelke	[39]
11	Masayasu Fukunaga	[22] [30] [33]
12	Hiroshi Furukawa	[12]
13	Patrick Girard	[40]
14	Dimitris Gizopoulos	[40]
15	Xinli Gu	[38]
16	Jonhson Guo	[20]
17	Shuji Hamada	[22] [30]
18	Yinhe Han	[16] [27]
19	Kazumi Hatayama	[33]
20	Tooru Honzawa	[8]
21	Fei-Sheng Hsu	[12]
22	P. Hsu	[21] [32]
23	Po-Ching Hsu	[20]
24	Yu Hu	[16] [19] [27]
25	Zhigang Jiang	[38]
26	Seiji Kajihara	[13] [14] [17] [18] [22] [23] [24] [25] [26] [28] [29] [30] [31] [33] [35] [36] [37] [39]
27	Kozo Kinoshita	[1] [2] [3] [5] [8] [11] [13] [15] [17] [18] [25] [26] [28] [31]
28	E. Lee	[21] [32]
29	Huawei Li	[16] [19] [27]
30	Lei Li	[24]
31	Xiaowei Li	[16] [19] [27]
32	Shyh-Horng Lin	[12]
33	Toshiyuki Maeda	[22] [30]
34	Yoshihiro Minamoto	[14]
35	Kohei Miyase	[14] [23] [26] [28] [29] [31] [35] [36] [37] [39]
36	Tokiharu Miyoshi	[13]
37	Shohei Morishima	[33]
38	Yusuke Nakamura	[37] [39]
39	Nicola Nicolici	[34] [40]
40	Yuji Ohsumi	[35]
41	J. Park	[21] [32]
42	Ilia Polian	[39]
43	Sudhakar M. Reddy	[23] [36]
44	Kaushik Roy	[40]
45	Kewal K. Saluja	[4] [8] [11] [13] [14] [15] [17] [18] [25] [26] [28] [29] [31] [35]
46	Yasuo Sato	[22] [30]
47	Boryau Sheu	[38]
48	Stefan Spinner	[39]
49	Tatsuya Suzuki	[14] [28] [29] [31] [35]
50	Hideo Tamamoto	[3] [5] [6] [8] [9] [11] [15] [17]
51	Kenta Terashima	[23] [36]
52	Sen-Wei Tsai	[12]
53	Hsin-Po Wang	[10]
54	Laung-Terng Wang	[12] [13] [14] [18] [20] [21] [25] [26] [28] [29] [31] [32] [38]
55	Zhigang Wang	[38]
56	Shianling Wu	[12] [20] [21] [32] [38]
57	Masahiro Yamamoto	[33]
58	Yoshiyuki Yamashita	[18] [25]
59	Yuta Yamato	[26] [29] [37]
60	Hiroshi Yokoyama	[6] [9]