| 2003 | ||
|---|---|---|
| 19 | Lee Whetsel: Adapting JTAG for AC Interconnect Testing. ITC 2003: 641-650 | |
| 18 | Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel: Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices. ITC 2003: 981-987 | |
| 17 | Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur: Overview of the IEEE P1500 Standard. ITC 2003: 988-997 | |
| 2002 | ||
| 16 | Lee Whetsel: Inevitable Use of TAP Domains in SOCs. ITC 2002: 1191 | |
| 2001 | ||
| 15 | Jayashree Saxena, Kenneth M. Butler, Lee Whetsel: An analysis of power reduction techniques in scan testing. ITC 2001: 670-677 | |
| 2000 | ||
| 14 | Lee Whetsel: Adapting scan architectures for low power operation. ITC 2000: 863-872 | |
| 1999 | ||
| 13 | Lee Whetsel: Addressable test ports an approach to testing embedded cores. ITC 1999: 1055-1064 | |
| 12 | Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel: Towards a standard for embedded core test: an example. ITC 1999: 616-627 | |
| 1998 | ||
| 11 | Lee Whetsel: Core test connectivity, communication, and control. ITC 1998: 303-312 | |
| 1997 | ||
| 10 | Lee Whetsel: Test Access of TAP'ed & Non-TAP'ed Cores. ITC 1997: 1041 | |
| 9 | Lee Whetsel: An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores. ITC 1997: 69-78 | |
| 8 | Lee Whetsel: A silicon El Niño? IEEE Design & Test of Computers 14(4): 112- (1997) | |
| 1996 | ||
| 7 | Lee Whetsel: Proposal to Simplify Development of a Mixed-Signal Test Standard. ITC 1996: 400-409 | |
| 1995 | ||
| 6 | Lee Whetsel: Improved Boundary Scan Design. ITC 1995: 851-860 | |
| 1994 | ||
| 5 | Lee Whetsel: Navigating Test Access in Systems. ITC 1994: 1018 | |
| 4 | Lee Whetsel: An Approach to Accelerate Scan Testing in IEEE 1149.1 Architectures. ITC 1994: 314-322 | |
| 1993 | ||
| 3 | Lee Whetsel: Hierarchically Accessing 1149.1 Applications in a System Environment. ITC 1993: 517-526 | |
| 1992 | ||
| 2 | Lee Whetsel: A Proposed Method of Accessing 1149.1 in a Backplane Environment. ITC 1992: 206-216 | |
| 1991 | ||
| 1 | Lee Whetsel: An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip. ITC 1991: 869-878 | |