Thomas W. Williams

	2008
46		Thomas W. Williams: EDA to the Rescue of the Silicon Roadmap. ISMVL 2008: 1
45		Rohit Kapur, Subhasish Mitra, Thomas W. Williams: Historical Perspective on Scan Compression. IEEE Design & Test of Computers 25(2): 114-120 (2008)
	2007
44		Maria Gkatziani, Rohit Kapur, Qing Su, Ben Mathew, Roberto Mattiuzzo, Laura Tarantini, Cy Hay, Salvatore Talluto, Thomas W. Williams: Accurately Determining Bridging Defects from Layout. DDECS 2007: 87-90
43		Thomas W. Williams: EDA to the Rescue of the Silicon Roadmap. ISQED 2007: 115-118
42		Peter Wohl, John A. Waicukauski, Rohit Kapur, S. Ramnath, Emil Gizdarski, Thomas W. Williams, P. Jaini: Minimizing the Impact of Scan Compression. VTS 2007: 67-74
	2005
41		Thomas W. Williams: Design for Testability: The Path to Deep Submicron. Asian Test Symposium 2005
40		Thomas W. Williams: TTTC recognizes test visionary's lifetime contribution. IEEE Design & Test of Computers 22(3): 282, 285 (2005)
	2004
39		Nodari Sitchinava, Samitha Samaranayake, Rohit Kapur, Emil Gizdarski, Frederic Neuveux, Thomas W. Williams: Changing the Scan Enable during Shift. VTS 2004: 73-78
	2003
38		Nahmsuk Oh, Rohit Kapur, Thomas W. Williams, Jim Sproch: Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture. DATE 2003: 10110-10115
37		Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir: Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects. ITC 2003: 1041-1050
36		Samitha Samaranayake, Emil Gizdarski, Nodari Sitchinava, Frederic Neuveux, Rohit Kapur, Thomas W. Williams: A Reconfigurable Shared Scan-in Architecture. VTS 2003: 9-14
	2002
35		Rohit Kapur, Thomas W. Williams: Manufacturing Test of SoCs. Asian Test Symposium 2002: 317-319
34		Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC 2002: 371-374
33		Rohit Kapur, Thomas W. Williams, M. Ray Mercer: Directed-Binary Search in Logic BIST Diagnostics. DATE 2002: 1121
32		Nahmsuk Oh, Rohit Kapur, Thomas W. Williams: Fast seed computation for reseeding shift register in test pattern compression. ICCAD 2002: 76-81
31		Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. ITC 2002: 407-416
30		Samitha Samaranayake, Nodari Sitchinava, Rohit Kapur, Minesh B. Amin, Thomas W. Williams: Dynamic Scan: Driving Down the Cost of Test. IEEE Computer 35(10): 63-68 (2002)
	2001
29		Peter Wohl, John A. Waicukauski, Thomas W. Williams: Design of compactors for signature-analyzers in built-in self-test. ITC 2001: 54-63
28		Rohit Kapur, Thomas W. Williams: Tester retargetable patterns. ITC 2001: 721-727
27		Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir: A new methodology for improved tester utilization. ITC 2001: 916-923
26		Rohit Kapur, R. Chandramouli, Thomas W. Williams: Strategies for Low-Cost Test. IEEE Design & Test of Computers 18(6): 47-54 (2001)
	2000
25		F. Hayat, Thomas W. Williams, Rohit Kapur, D. Hsu: DFT closure. Asian Test Symposium 2000: 8-9
24		Thomas W. Williams, Rohit Kapur: Design for Testability in Nanometer Technologies; Searching for Quality. ISQED 2000: 167-172
23		Rohit Kapur, Cy Hay, Thomas W. Williams: The Mutating Metric for Benchmarking Test. IEEE Design & Test of Computers 17(3): 18-21 (2000)
22		Don MacMillen, Raul Camposano, Dwight D. Hill, Thomas W. Williams: An industrial view of electronic design automation. IEEE Trans. on CAD of Integrated Circuits and Systems 19(12): 1428-1448 (2000)
	1999
21		Rohit Kapur, Thomas W. Williams: Tough Challenges as Design and Test Go Nanometer - Guest Editors' Introduction. IEEE Computer 32(11): 42-45 (1999)
	1996
20		Li-C. Wang, M. Ray Mercer, Thomas W. Williams: A Better ATPG Algorithm and Its Design Principles. ICCD 1996: 248-253
19		Li-C. Wang, M. Ray Mercer, Thomas W. Williams: Using Target Faults To Detect Non-Tartget Defects. ITC 1996: 629-638
18		Thomas W. Williams, Robert H. Dennard, Rohit Kapur, M. Ray Mercer, Wojciech Maly: IDDQ Test: Sensitivity Analysis of Scaling. ITC 1996: 786-792
17		José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Cristoforo Marzocca, Francesco Corsi, Thomas W. Williams: Defect level evaluation in an IC design environment. IEEE Trans. on CAD of Integrated Circuits and Systems 15(10): 1286-1293 (1996)
16		Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams: A weighted random pattern test generation system. IEEE Trans. on CAD of Integrated Circuits and Systems 15(8): 1020-1025 (1996)
	1995
15		Li-C. Wang, M. Ray Mercer, Thomas W. Williams: On Efficiently and Reliably Achieving Low Defective Part Levels. ITC 1995: 616-625
14		Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams: On the decline of testing efficiency as fault coverage approaches 100%. VTS 1995: 74-83
	1994
13		José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Thomas W. Williams: Fault Modeling and Defect Level Projections in Digital ICs. EDAC-ETC-EUROASIC 1994: 436-442
12		Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams: Design of an Efficient Weighted-Random-Pattern Generation System. ITC 1994: 491-500
	1993
11		Thomas W. Williams: Design for Testability: Today and in the Future. ICCD 1993: 14
	1992
10		Eun Sei Park, M. Ray Mercer, Thomas W. Williams: The Total Delay Fault Model and Statistical Delay Fault Coverage. IEEE Trans. Computers 41(6): 688-698 (1992)
	1991
9		Thomas W. Williams, Bill Underwood, M. Ray Mercer: The Interdependence Between Delay-Optimization of Synthesized Networks and Testing. DAC 1991: 87-92
8		Kenneth D. Wagner, Thomas W. Williams: Enhancing Board Functional Self-Test by Concurrent Sampling. ITC 1991: 633-640
7		Eun Sei Park, Bill Underwood, Thomas W. Williams, M. Ray Mercer: Delay Testing Quality in Timing-Optimized Designs. ITC 1991: 897-905
	1989
6		Thomas W. Williams: Future Trends in the Testing. IFIP Congress 1989: 1019-1020
	1988
5		Eun Sei Park, Thomas W. Williams, M. Ray Mercer: Statistical Delay Fault Coverage and Defect Level for Delay Faults. ITC 1988: 492-499
4		Kenneth D. Wagner, Thomas W. Williams: Design for Testability of Mixed Signal Integrated Circuits. ITC 1988: 823-828
	1984
3		Thomas W. Williams: VLSI Testing. IEEE Computer 17(10): 126-136 (1984)
	1982
2		Eugen I. Muehldorf, Thomas W. Williams: Analysis of the Switching Behavior of Combinatorial Logic Networks. ITC 1982: 379-390
1		Thomas W. Williams, Kenneth P. Parker: Design for Testability - A Survey. IEEE Trans. Computers 31(1): 2-15 (1982)

Coauthor Index

1	Magdy S. Abadir	[37]
2	Minesh B. Amin	[30]
3	David Armstrong	[27]
4	Raul Camposano	[22]
5	R. Chandramouli	[26]
6	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[31] [34] [37]
7	Francesco Corsi	[17]
8	Robert H. Dennard	[18]
9	Jennifer Dworak	[31] [34]
10	Emil Gizdarski	[36] [39] [42]
11	Maria Gkatziani	[44]
12	Fernando M. Gonçalves	[13] [17]
13	Cy Hay	[23] [44]
14	F. Hayat	[25]
15	Dwight D. Hill	[22]
16	D. Hsu	[25]
17	P. Jaini	[42]
18	Sophia W. Kao	[14]
19	Rohit Kapur	[12] [16] [18] [21] [23] [24] [25] [26] [27] [28] [30] [31] [32] [33] [34] [35] [36] [38] [39] [42] [44] [45]
20	Ajay Khoche	[27]
21	Angela Krstic	[37]
22	Leonard Lee	[37]
23	Jing-Jia Liou	[31] [34]
24	Don MacMillen	[22]
25	Wojciech Maly	[18]
26	Cristoforo Marzocca	[17]
27	Ben Mathew	[44]
28	Roberto Mattiuzzo	[44]
29	M. Ray Mercer	[5] [7] [9] [10] [14] [15] [18] [19] [20] [31] [33] [34] [37]
30	Subhasish Mitra	[45]
31	Eugen I. Muehldorf	[2]
32	Frederic Neuveux	[36] [39]
33	Nahmsuk Oh	[32] [38]
34	Eun Sei Park	[5] [7] [10]
35	Kenneth P. Parker	[1]
36	Srinivas Patil	[12] [16]
37	S. Ramnath	[42]
38	Jochen Rivoir	[27]
39	Samitha Samaranayake	[30] [36] [39]
40	Nodari Sitchinava	[30] [36] [39]
41	Thomas J. Snethen	[12] [16]
42	José T. de Sousa	[13] [17]
43	Jim Sproch	[38]
44	Qing Su	[44]
45	Salvatore Talluto	[44]
46	Laura Tarantini	[44]
47	Mick Tegethoff	[27]
48	João Paulo Teixeira	[13] [17]
49	Bill Underwood	[7] [9]
50	Kenneth D. Wagner	[4] [8]
51	John A. Waicukauski	[29] [42]
52	Li-C. Wang	[14] [15] [19] [20] [31] [34] [37]
53	Peter Wohl	[29] [42]

Colors in the list of coauthors