 | 2009 |
|---|
| 5 |       | Kedarnath J. Balakrishnan,
Grady Giles,
James Wingfield:
Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor.
IEEE Design & Test of Computers 26(1): 52-59 (2009) |
| 2004 |
|---|
| 4 | | Jennifer Dworak,
Brad Cobb,
James Wingfield,
M. Ray Mercer:
Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects.
DATE 2004: 1066-1071 |
| 3 | | Jennifer Dworak,
James Wingfield,
M. Ray Mercer:
A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects.
DFT 2004: 460-468 |
| 2003 |
|---|
| 2 | | James Wingfield,
Jennifer Dworak,
M. Ray Mercer:
Function-Based Dynamic Compaction and its Impact on Test Set Sizes.
DFT 2003: 167-174 |
| 2002 |
|---|
| 1 | | Jennifer Dworak,
James Wingfield,
Brad Cobb,
Sooryong Lee,
Li-C. Wang,
M. Ray Mercer:
Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults.
DFT 2002: 177-185 |
