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1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMaxim Ershov, Sharad Saxena, Sean Minehane, P. Clifton, Mark Redford, R. Lindley, H. Karbasi, S. Graves, S. Winters: Degradation dynamics, recovery, and characterization of negative bias temperature instability. Microelectronics Reliability 45(1): 99-105 (2005)

Coauthor Index

1P. Clifton [1]
2Maxim Ershov [1]
3S. Graves [1]
4H. Karbasi [1]
5R. Lindley [1]
6Sean Minehane [1]
7Mark Redford [1]
8Sharad Saxena [1]

Copyright © Tue Dec 8 16:10:42 2009 by Michael Ley (ley@uni-trier.de)