Mike W. T. Wong

	2004
13		Mike W. T. Wong, Yubin Zhang: Design and Implementation of Self-Testable Full Range Window Comparator. Asian Test Symposium 2004: 314-318
	2003
12		Mike W. T. Wong: Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis. Asian Test Symposium 2003: 120-123
	2002
11		K. Y. Ko, Mike W. T. Wong, Y. S. Lee: Testing System-On-Chip by Summations of Cores? Test Output Voltages. Asian Test Symposium 2002: 350-355
10		Mike W. T. Wong, K. Y. Ko, Y. S. Lee: Analog and Mixed-Signal IP Cores Testing. DELTA 2002: 3-7
9		Matthew Worsman, Mike W. T. Wong, Y. S. Lee: Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis. DELTA 2002: 443-446
	2000
8		K. Y. Ko, Mike W. T. Wong: New built-in self-test technique based on addition/subtraction of selected node voltages. Asian Test Symposium 2000: 39-
7		Matthew Worsman, Mike W. T. Wong, Y. S. Lee: Analog circuit equivalent faults in the D.C. domain. Asian Test Symposium 2000: 84-89
6		Matthew Worsman, Mike W. T. Wong, Y. S. Lee: A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality. ISQED 2000: 361-368
	1998
5		Mike W. T. Wong, Matthew Worsman: DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity. Asian Test Symposium 1998: 366-371
	1997
4		Joseph C. W. Pang, Mike W. T. Wong, Y. S. Lee: Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits. Asian Test Symposium 1997: 82-87
	1996
3		Tao Wei, Mike W. T. Wong, Y. S. Lee: Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation. Asian Test Symposium 1996: 232-237
2		Yingquan Zhou, Mike W. T. Wong, Yinghua Min: Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis. J. Electronic Testing 9(1-2): 153-163 (1996)
	1995
1		Yingquan Zhou, Mike W. T. Wong, Yinghua Min: Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers. FTCS 1995: 238-247

Coauthor Index

1	K. Y. Ko	[8] [10] [11]
2	Y. S. Lee	[3] [4] [6] [7] [9] [10] [11]
3	Yinghua Min	[1] [2]
4	Joseph C. W. Pang	[4]
5	Tao Wei	[3]
6	Matthew Worsman	[5] [6] [7] [9]
7	Yubin Zhang	[13]
8	Yingquan Zhou	[1] [2]

Colors in the list of coauthors