Ken Wu

	2001
1		Yung-Huei Lee, Tom Linton, Ken Wu, Neal Mielke: Effect of trench edge on pMOSFET reliability. Microelectronics Reliability 41(5): 689-696 (2001)

Coauthor Index

1	Yung-Huei Lee	[1]
2	Tom Linton	[1]
3	Neal Mielke	[1]