 | 2008 |
|---|
| 8 |       | Hanqing Xing,
Degang Chen,
Randall L. Geiger:
On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering.
EIT 2008: 117-122 |
| 7 | | Hanqing Xing,
Degang Chen,
Randall L. Geiger,
Le Jin:
System identification -based reduced-code testing for pipeline ADCs' linearity test.
ISCAS 2008: 2402-2405 |
| 2006 |
|---|
| 6 | | Le Jin,
Hanqing Xing,
Degang Chen,
Randall L. Geiger:
A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient.
ISCAS 2006 |
| 5 | | Hanqing Xing,
Le Jin,
Degang Chen,
Randall L. Geiger:
Characterization of a current-mode bandgap circuit structure for high-precision reference applications.
ISCAS 2006 |
| 4 | | Hanqing Xing,
Degang Chen,
Randall L. Geiger:
Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs.
ISCAS 2006 |
| 2005 |
|---|
| 3 | | Wenbo Liu,
Hanqing Xing,
Le Jin,
Randall L. Geiger,
Degang Chen:
A test strategy for time-to-digital converters using dynamic element matching and dithering.
ISCAS (4) 2005: 3809-3812 |
| 2 | | Hanqing Xing,
Degang Chen,
Randall L. Geiger:
A two-step DDEM ADC for accurate and cost-effective DAC testing.
ISCAS (5) 2005: 4289-4292 |
| 1 | | Xin Dai,
Chengming He,
Hanqing Xing,
Degang Chen,
Randall L. Geiger:
An N/sup th/ order central symmetrical layout pattern for nonlinear gradients cancellation.
ISCAS (5) 2005: 4835-4838 |
