Shiyi Xu Coauthor index DBLP Vis pubzone.org

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17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu: Orderly Random Testing for Both Hardware and Software. PRDC 2008: 160-167
2007
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu: An Accurate Model of Software Reliability. PRDC 2007: 77-84
2006
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu: A New Approach to Improving the Test Effectiveness in Software Testing Using Fault Collapsing. PRDC 2006: 73-80
2005
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu: Pseudo-Parity Testing with Testable Design. Asian Test Symposium 2005: 354-359
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu: High-Order Syndrome Testing for VLSI Circuits. PRDC 2005: 101-108
2004
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu: A Systematic Way of Functional Testing for VLSI Chips. Asian Test Symposium 2004: 170-175
11no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDebesh K. Das, Hideo Fujiwara, Yungang Li, Yinghua Min, Shiyi Xu, Yervant Zorian: Design & Test Education in Asia. IEEE Design & Test of Computers 21(4): 331-338 (2004)
2003
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu: Build-In-Self-Test for Software. Asian Test Symposium 2003: 220-223
2002
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu, Jianwen Chen: Maximum Distance Testing. Asian Test Symposium 2002: 15-
2001
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu: Non-exhaustive Parity Testing. Asian Test Symposium 2001: 468
2000
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu, Wei Cen: Forecasting the efficiency of test generation algorithms for digital circuits. Asian Test Symposium 2000: 179-
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu, Tukwasibwe Justaf Frank: Forecasting the Efficiency of Test Generation Algorithms for Combinational Circuits. J. Comput. Sci. Technol. 15(4): 326-337 (2000)
1999
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu, Tukwasibwe Justaf Frank: An Evaluation of Test Generation Algorithms for combinational Circuits. Asian Test Symposium 1999: 63-69
1998
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu, Jianhua Gao: An Efficient Random-like Testing. Asian Test Symposium 1998: 504-
1997
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu, Peter Waignjo, Percy G. Dias, Bole Shi: Testability Prediction for Sequential Circuits Using Neural Network. Asian Test Symposium 1997: 48-
1995
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu, Gercy P. Dias: Testability forecasting for sequential circuits. Asian Test Symposium 1995: 199-205
1985
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShiyi Xu, Stephen Y. H. Su: Detecting I/O and Internal Feedback Bridging Faults. IEEE Trans. Computers 34(6): 553-557 (1985)

Coauthor Index

1Wei Cen [7]
2Jianwen Chen [9]
3Debesh Kumar Das (Debesh K. Das) [11]
4Gercy P. Dias [2]
5Percy G. Dias [3]
6Tukwasibwe Justaf Frank [5] [6]
7Hideo Fujiwara [11]
8Jianhua Gao [4]
9Yungang Li [11]
10Yinghua Min [11]
11Baile Shi (Bole Shi) [3]
12Stephen Y. H. Su [1]
13Peter Waignjo [3]
14Yervant Zorian [11]

Colors in the list of coauthors

Copyright © Fri Dec 4 16:04:45 2009 by Michael Ley (ley@uni-trier.de)