 | 2008 |
|---|
| 5 |       | Kenta Yamada,
Noriaki Oda:
Statistical Corner Conditions of Interconnect Delay (Corner LPE Specifications).
IEICE Transactions 91-C(4): 562-570 (2008) |
| 4 | | Kenta Yamada,
Hiroshi Kitahara,
Yoshihiko Asai,
Hideo Sakamoto,
Norio Okada,
Makoto Yasuda,
Noriaki Oda,
Michio Sakurai,
Masayuki Hiroi,
Toshiyuki Takewaki,
Sadayuki Ohnishi,
Manabu Iguchi,
Hiroyasu Minda,
Mieko Suzuki:
Accurate Modeling Method for Cu Interconnect.
IEICE Transactions 91-C(6): 968-977 (2008) |
| 3 | | Kenta Yamada,
Takashi Sato,
Shuhei Amakawa,
Noriaki Nakayama,
Kazuya Masu,
Shigetaka Kumashiro:
Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress.
IEICE Transactions 91-C(7): 1142-1150 (2008) |
| 2007 |
|---|
| 2 | | Noriaki Oda,
Hironori Imura,
Naoyoshi Kawahara,
Masayoshi Tagami,
Hiroyuki Kunishima,
Shuji Sone,
Sadayuki Ohnishi,
Kenta Yamada,
Yumi Kakuhara,
Makoto Sekine,
Yoshihiro Hayashi,
Kazuyoshi Ueno:
Chip-Level Performance Maximization Using ASIS (Application-Specific Interconnect Structure) Wiring Design Concept for 45 nm CMOS Generation.
IEICE Transactions 90-C(4): 848-855 (2007) |
| 2006 |
|---|
| 1 | | Kenta Yamada,
Noriaki Oda:
Statistical corner conditions of interconnect delay (corner LPE specifications).
ASP-DAC 2006: 706-711 |
