Michihiro Yamada

	1991
2		Yoshikazu Morooka, Shigeru Mori, Hiroshi Miyamoto, Michihiro Yamada: An Address Maskable Parallel Testing for Ultra High Density DRAMs. ITC 1991: 556-563
	1985
1		Hiroshi Miyamoto, Koichiro Mashiko, Yoshikazu Morooka, Kazutami Arimoto, Michihiro Yamada, T. Nakano: Test Pattern Considerations for Fault Tolerant High Density DRAM. ITC 1985: 451-455

Coauthor Index

1	Kazutami Arimoto	[1]
2	Koichiro Mashiko	[1]
3	Hiroshi Miyamoto	[1] [2]
4	Shigeru Mori	[2]
5	Yoshikazu Morooka	[1] [2]
6	T. Nakano	[1]