Shie-Shien Yang

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2005

1 A. A. Alhadeed, Shie-Shien Yang: Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. IEEE Transactions on Reliability 54(1): 64-68 (2005)

	2005
1		A. A. Alhadeed, Shie-Shien Yang: Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. IEEE Transactions on Reliability 54(1): 64-68 (2005)

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