Xiangning Yang

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2007

2 Xiangning Yang, Kewal K. Saluja: Combating NBTI Degradation via Gate Sizing. ISQED 2007: 47-52

1 Xiangning Yang, Eric F. Weglarz, Kewal K. Saluja: On NBTI Degradation Process in Digital Logic Circuits. VLSI Design 2007: 723-730

	2007
2		Xiangning Yang, Kewal K. Saluja: Combating NBTI Degradation via Gate Sizing. ISQED 2007: 47-52
1		Xiangning Yang, Eric F. Weglarz, Kewal K. Saluja: On NBTI Degradation Process in Digital Logic Circuits. VLSI Design 2007: 723-730

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