Gilbert Yoh
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2000
1
Gilbert Yoh,
Farid N. Najm
: A Statistical Model for Electromigration Failures.
ISQED 2000
: 45-50
Coauthor Index
1
Farid N. Najm
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Copyright ©
Tue Dec 22 17:48:42 2009 by
Michael Ley
(
ley@uni-trier.de
)
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