Ryozou Yoshino

	1995
3		Shuji Kikuchi, Yoshihiko Hayashi, Takashi Suga, Jun Saitou, Masahiko Kaneko, Takashi Matsumoto, Ryozou Yoshino: A Gate-Array-Based 666MHz VLSI Test System. ITC 1995: 451-458
	1989
2		Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi: A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability. ITC 1989: 558-566
	1985
1		Ryozou Yoshino, Ryuichi Takagi: Custom VLSI Test System. ITC 1985: 431-437

Coauthor Index

1	Yoshihiko Hayashi	[2] [3]
2	Masahiko Kaneko	[3]
3	Shuji Kikuchi	[2] [3]
4	Takashi Matsumoto	[2] [3]
5	Jun Saitou	[3]
6	Takashi Suga	[3]
7	Ryuichi Takagi	[1] [2]