Abdel-Fattah Yousif

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1995

2 Abdel-Fattah Yousif, Jun Gu: Concurrent automatic test pattern generation algorithm for combinational circuits. ICCD 1995: 286-291

1993

1 Abdel-Fattah Yousif, Jun Gu: An Efficient Global Search Algorithm for Test Generation. ISCAS 1993: 1499-1502

	1995
2		Abdel-Fattah Yousif, Jun Gu: Concurrent automatic test pattern generation algorithm for combinational circuits. ICCD 1995: 286-291
	1993
1		Abdel-Fattah Yousif, Jun Gu: An Efficient Global Search Algorithm for Test Generation. ISCAS 1993: 1499-1502

Coauthor Index

1 Jun Gu [1] [2]