 | 2006 |
|---|
| 5 |       | Chaowen Yu,
Sudhakar M. Reddy,
Irith Pomeranz:
A Partitioning Technique for Identification of Error-Capturing Scan Cells in Scan-BIST.
IOLTS 2006: 37-42 |
| 2005 |
|---|
| 4 | | Chaowen Yu,
Sudhakar M. Reddy,
Irith Pomeranz:
Circuit Independent Weighted Pseudo-Random BIST Pattern Generator.
Asian Test Symposium 2005: 132-137 |
| 2004 |
|---|
| 3 | | Chaowen Yu,
Sudhakar M. Reddy,
Irith Pomeranz:
Weighted Pseudo-Random BIST for N-Detection of Single Stuck-at Faults.
Asian Test Symposium 2004: 178-183 |
| 2003 |
|---|
| 2 | | Wei Li,
Chaowen Yu,
Sudhakar M. Reddy,
Irith Pomeranz:
A scan BIST generation method using a markov source and partial bit-fixing.
DAC 2003: 554-559 |
| 1 | | Chaowen Yu,
Wei Li,
Sudhakar M. Reddy,
Irith Pomeranz:
An Improved Markov Source Design for Scan BIST.
IOLTS 2003: 106-110 |
